{"title":"Performance optimization under rise and fall parameters","authors":"R. Murgai","doi":"10.1109/ICCAD.1999.810646","DOIUrl":null,"url":null,"abstract":"Typically, cell parameters such as the pin-to-pin intrinsic delays, load-dependent coefficients, and input pin capacitances have different values for rising and falling signals. The performance optimization algorithms, however, assume a single value for each parameter. No work has been done to study the impact of separate rise and fall values on the complexity of optimization. We take the first step towards understanding this impact. We pick two problems that have polynomial-time complexities if a single value for each cell parameter is assumed. The first problem is that of buffer insertion on a fixed topology net to maximize the required time at the source of the net. The second is the gate resizing problem (and the more general technology mapping problem) for minimizing the circuit delay under the simplest, load-independent delay model. We show that under separate rise and fall parameters, both these problems become NP-complete. To the best of our knowledge, this is the first such result showing the effect of rise and fall parameters on the complexity of performance optimization problems. We then address the important question of devising a good practical algorithm for local fanout optimization.","PeriodicalId":6414,"journal":{"name":"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1999-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1999.810646","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
Abstract
Typically, cell parameters such as the pin-to-pin intrinsic delays, load-dependent coefficients, and input pin capacitances have different values for rising and falling signals. The performance optimization algorithms, however, assume a single value for each parameter. No work has been done to study the impact of separate rise and fall values on the complexity of optimization. We take the first step towards understanding this impact. We pick two problems that have polynomial-time complexities if a single value for each cell parameter is assumed. The first problem is that of buffer insertion on a fixed topology net to maximize the required time at the source of the net. The second is the gate resizing problem (and the more general technology mapping problem) for minimizing the circuit delay under the simplest, load-independent delay model. We show that under separate rise and fall parameters, both these problems become NP-complete. To the best of our knowledge, this is the first such result showing the effect of rise and fall parameters on the complexity of performance optimization problems. We then address the important question of devising a good practical algorithm for local fanout optimization.