{"title":"Degradation Analysis of PV Modules After Long-Term Exposure in Florida","authors":"E. Schneller, O. Shinde, N. Dhere, K. Davis","doi":"10.1109/PVSC.2018.8547593","DOIUrl":null,"url":null,"abstract":"Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"7 1","pages":"0767-0770"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2018.8547593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.
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