P. Wobrauschek, P. Kregsamer, W. Ladisich, R. Riede, C. Streli, S. Garbe, M. Haller, A. Knöchel, M. Radtke
{"title":"Txrf-Sources-Samples and Detectors","authors":"P. Wobrauschek, P. Kregsamer, W. Ladisich, R. Riede, C. Streli, S. Garbe, M. Haller, A. Knöchel, M. Radtke","doi":"10.1154/S0376030800023211","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"34 1","pages":"755-766"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in x-ray analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1154/S0376030800023211","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}