T. Sakata, S. Morita, O. Nagashima, H. Noda, T. Takahashi, T. Sonoda, H. Tadokoro, H. Ichikawa, T. Adou, S. Hanzawa, M. Ohi, S. Ookuma, Y. Suzuki, H. Tanaka, K. Ishii
{"title":"A DDR/SDR-compatible SDRAM design with a three-size flexible column redundancy","authors":"T. Sakata, S. Morita, O. Nagashima, H. Noda, T. Takahashi, T. Sonoda, H. Tadokoro, H. Ichikawa, T. Adou, S. Hanzawa, M. Ohi, S. Ookuma, Y. Suzuki, H. Tanaka, K. Ishii","doi":"10.1109/VLSIC.2000.852866","DOIUrl":null,"url":null,"abstract":"Two circuit techniques are proposed to design a SDRAM which operates both at a double-data-rate (DDR) and a single-data-rate (SDR). The common/separated I/O scheme enables 2-bit prefetching under a DDR and interrupt operations under an SDR with half the number of data-bus lines otherwise needed. The SSTL/LVTTL-compatible input buffer allows a narrow setup/hold time. Furthermore, the three-size flexible column redundancy enhances the yield. To evaluate these techniques, a 256-Mb SDRAM has been designed assuming 0.16-/spl mu/m technology and simulated with 167-MHz operations.","PeriodicalId":6361,"journal":{"name":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","volume":"11 1","pages":"116-119"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2000.852866","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Two circuit techniques are proposed to design a SDRAM which operates both at a double-data-rate (DDR) and a single-data-rate (SDR). The common/separated I/O scheme enables 2-bit prefetching under a DDR and interrupt operations under an SDR with half the number of data-bus lines otherwise needed. The SSTL/LVTTL-compatible input buffer allows a narrow setup/hold time. Furthermore, the three-size flexible column redundancy enhances the yield. To evaluate these techniques, a 256-Mb SDRAM has been designed assuming 0.16-/spl mu/m technology and simulated with 167-MHz operations.