Safe levels of silicone contamination for electrical contact

T. Tamai, M. Aramata
{"title":"Safe levels of silicone contamination for electrical contact","authors":"T. Tamai, M. Aramata","doi":"10.1109/HOLM.1993.489686","DOIUrl":null,"url":null,"abstract":"The effect of silicone vapour concentration on the contact failure was examined by using micro relays and motor brush-slip ring (commutator) contacts. A minimum limiting concentration level which does not affect contact reliability was found. This limiting level was 10 ppm (0.13 mg/1). Validity of the limiting level was confirmed by the relationships among concentration, temperature, SiO/sub 2/ film thickness and contact resistance. Furthermore, the effect of the degree of silicone polymerization on the limiting concentration was derived by an empirical formula. These results were confirmed by the contact failure data due to the silicone contamination.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"31 1","pages":"269-273"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1993.489686","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

The effect of silicone vapour concentration on the contact failure was examined by using micro relays and motor brush-slip ring (commutator) contacts. A minimum limiting concentration level which does not affect contact reliability was found. This limiting level was 10 ppm (0.13 mg/1). Validity of the limiting level was confirmed by the relationships among concentration, temperature, SiO/sub 2/ film thickness and contact resistance. Furthermore, the effect of the degree of silicone polymerization on the limiting concentration was derived by an empirical formula. These results were confirmed by the contact failure data due to the silicone contamination.
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电接触硅污染的安全等级
采用微继电器和电机电刷-滑环(换向器)触点研究了硅酮蒸气浓度对触点失效的影响。找到了不影响接触可靠性的最小极限浓度。该限值为10 ppm (0.13 mg/1)。通过浓度、温度、SiO/sub - 2/薄膜厚度和接触电阻之间的关系验证了极限水平的有效性。通过经验公式推导出硅酮聚合度对极限浓度的影响。这些结果被硅污染导致的触点失效数据所证实。
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