Peng Chen, Xiongchuan Huang, Yao-Hong Liu, M. Ding, Cui Zhou, A. Ba, K. Philips, H. D. Groot, R. Staszewski
{"title":"Design and built-in characterization of digital-to-time converters for ultra-low power ADPLLs","authors":"Peng Chen, Xiongchuan Huang, Yao-Hong Liu, M. Ding, Cui Zhou, A. Ba, K. Philips, H. D. Groot, R. Staszewski","doi":"10.1109/ESSCIRC.2015.7313882","DOIUrl":null,"url":null,"abstract":"The newly proposed phase-prediction counter-based ADPLL has achieved a wireless standard-compliant performance at ultra-low power consumption. The digital-to-time converter (DTC) is the key enabler but is nonlinearity can easily create fractional spurs. This paper analyzes the effect of the DTC nonlinearity on in-band fractional spurs and proposes a method to characterize it in a built-in fashion by means of a fine-resolution ΔΣ TDC that forms an outer loop with the DTC. The TDC is realized in 40nm CMOS and exhibits only 1.8ps rms of random jitter.","PeriodicalId":11845,"journal":{"name":"ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)","volume":"2 1","pages":"283-286"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.2015.7313882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
The newly proposed phase-prediction counter-based ADPLL has achieved a wireless standard-compliant performance at ultra-low power consumption. The digital-to-time converter (DTC) is the key enabler but is nonlinearity can easily create fractional spurs. This paper analyzes the effect of the DTC nonlinearity on in-band fractional spurs and proposes a method to characterize it in a built-in fashion by means of a fine-resolution ΔΣ TDC that forms an outer loop with the DTC. The TDC is realized in 40nm CMOS and exhibits only 1.8ps rms of random jitter.