{"title":"改进了用于逻辑和布局优化的有效电容计算","authors":"A. Kahng, S. Muddu","doi":"10.1109/ICVD.1999.745217","DOIUrl":null,"url":null,"abstract":"We describe an improved iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. The speed and accuracy of our approach makes it suitable for the analysis loop within performance-driven iterative layout optimization. We present an iterationless approach for computing the effective capacitance of an interconnect load at a gate output when the slew time is non-zero (i.e., a ramp). We then extend this effective capacitance algorithm to complex gates, i.e., channel-connected components. Preliminary experimental results using the new effective capacitance approach show that the resulting delay estimates are quite accurate-within 15% of HSPICE-computed delays on data taken from a recent microprocessor design in 0.25 /spl mu/m CMOS technology. The improved driver model reduces the cell delay calculation errors to below 10%; this indicates that accurate modeling of effective capacitance is no longer the dominant source of errors in cell delay calculation.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"Improved effective capacitance computations for use in logic and layout optimization\",\"authors\":\"A. Kahng, S. Muddu\",\"doi\":\"10.1109/ICVD.1999.745217\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We describe an improved iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. The speed and accuracy of our approach makes it suitable for the analysis loop within performance-driven iterative layout optimization. We present an iterationless approach for computing the effective capacitance of an interconnect load at a gate output when the slew time is non-zero (i.e., a ramp). We then extend this effective capacitance algorithm to complex gates, i.e., channel-connected components. Preliminary experimental results using the new effective capacitance approach show that the resulting delay estimates are quite accurate-within 15% of HSPICE-computed delays on data taken from a recent microprocessor design in 0.25 /spl mu/m CMOS technology. The improved driver model reduces the cell delay calculation errors to below 10%; this indicates that accurate modeling of effective capacitance is no longer the dominant source of errors in cell delay calculation.\",\"PeriodicalId\":443373,\"journal\":{\"name\":\"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICVD.1999.745217\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745217","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved effective capacitance computations for use in logic and layout optimization
We describe an improved iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. The speed and accuracy of our approach makes it suitable for the analysis loop within performance-driven iterative layout optimization. We present an iterationless approach for computing the effective capacitance of an interconnect load at a gate output when the slew time is non-zero (i.e., a ramp). We then extend this effective capacitance algorithm to complex gates, i.e., channel-connected components. Preliminary experimental results using the new effective capacitance approach show that the resulting delay estimates are quite accurate-within 15% of HSPICE-computed delays on data taken from a recent microprocessor design in 0.25 /spl mu/m CMOS technology. The improved driver model reduces the cell delay calculation errors to below 10%; this indicates that accurate modeling of effective capacitance is no longer the dominant source of errors in cell delay calculation.