电容性硅体声谐振器的解析建模与数值模拟

G. Casinovi, X. Gao, F. Ayazi
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引用次数: 8

摘要

本文介绍了两种新开发的电容性硅体声谐振器模型。第一个模型是解析的,由SiBAR几何的线性弹性动力学方程的近似解得到。第二种是数值模拟,基于有限元,多物理场模拟声波在谐振器中的传播和器件电容间隙中的机电转导。后一种模型可以计算解析模型无法获得的SiBAR性能参数,例如转导面积与插入损失之间的关系。与电子束光刻技术制备的硅谐振器的测量结果进行比较表明,两种模型都可以预测sibar的谐振频率,相对误差小于1%。
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Analytical Modeling and Numerical Simulation of Capacitive Silicon Bulk Acoustic Resonators
This paper introduces two newly developed models of capacitive silicon bulk acoustic resonators (SiBARs). The first model is analytical and is obtained from an approximate solution of the linear elastodynamics equations for the SiBAR geometry. The second is numerical and is based on finite-element, multi-physics simulation of both acoustic wave propagation in the resonator and electromechanical transduction in the capacitive gaps of the device. This latter model makes it possible to compute SiBAR performance parameters that cannot be obtained from the analytical model, e.g. the relationship between transduction area and insertion loss. Comparisons with measurements taken on a set of silicon resonators fabricated using electron-beam lithography show that both models can predict the resonant frequencies of SiBARs with a relative error smaller than 1%.
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