Intel Fab18中的QUEST系统:一种基于网络的质量管理方法

2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203) Pub Date : 2001-10-08 DOI:10.1109/ISSM.2001.963008

Y. Kaplan

{"title":"Intel Fab18中的QUEST系统:一种基于网络的质量管理方法","authors":"Y. Kaplan","doi":"10.1109/ISSM.2001.963008","DOIUrl":null,"url":null,"abstract":"The QUEST System provides a web-based platform for the standardized management, tracking and assessment of quality excursion events across an entire Fab. The system has become the pivot of Intel Corporation Fab18's quality excursion event management and is now in the process of implementation in other factories.","PeriodicalId":356225,"journal":{"name":"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"The QUEST System in Intel Fab18: a web-based method for the management of quality\",\"authors\":\"Y. Kaplan\",\"doi\":\"10.1109/ISSM.2001.963008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The QUEST System provides a web-based platform for the standardized management, tracking and assessment of quality excursion events across an entire Fab. The system has become the pivot of Intel Corporation Fab18's quality excursion event management and is now in the process of implementation in other factories.\",\"PeriodicalId\":356225,\"journal\":{\"name\":\"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSM.2001.963008\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM.2001.963008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

QUEST系统为整个工厂的质量偏移事件的标准化管理、跟踪和评估提供了一个基于网络的平台。该系统已成为英特尔公司Fab18质量偏差事件管理的枢纽，目前正在其他工厂实施。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The QUEST System in Intel Fab18: a web-based method for the management of quality

The QUEST System provides a web-based platform for the standardized management, tracking and assessment of quality excursion events across an entire Fab. The system has become the pivot of Intel Corporation Fab18's quality excursion event management and is now in the process of implementation in other factories.

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2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)

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