{"title":"脉冲欧姆非线性技术作为预测电迁移损伤敏感性的可靠性工具的评价","authors":"J. Lloyd, G. Prokop, M.E. Molchen","doi":"10.1109/IRPS.1980.362919","DOIUrl":null,"url":null,"abstract":"The degree of correlation between time to failure by electromigration stressing and pulse ohmic - non-linearity was found to depend markedly on the stress conditions. Only the highest stress and highest joule heating resulted in good correlation. Also, a simple resistance measurement was found to correlate as well with time to failure as pulse non-linearity. It was concluded that pulse non-linearity techniques are of limited usefulness as a reliability tool for all but those applications where severe joule heating is present.","PeriodicalId":270567,"journal":{"name":"18th International Reliability Physics Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evaluation of the Pulse Ohmic Non-Linearity Technique as a Reliability Tool for Predicting Susceptibility to Electromigration Damage\",\"authors\":\"J. Lloyd, G. Prokop, M.E. Molchen\",\"doi\":\"10.1109/IRPS.1980.362919\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The degree of correlation between time to failure by electromigration stressing and pulse ohmic - non-linearity was found to depend markedly on the stress conditions. Only the highest stress and highest joule heating resulted in good correlation. Also, a simple resistance measurement was found to correlate as well with time to failure as pulse non-linearity. It was concluded that pulse non-linearity techniques are of limited usefulness as a reliability tool for all but those applications where severe joule heating is present.\",\"PeriodicalId\":270567,\"journal\":{\"name\":\"18th International Reliability Physics Symposium\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"18th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1980.362919\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1980.362919","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of the Pulse Ohmic Non-Linearity Technique as a Reliability Tool for Predicting Susceptibility to Electromigration Damage
The degree of correlation between time to failure by electromigration stressing and pulse ohmic - non-linearity was found to depend markedly on the stress conditions. Only the highest stress and highest joule heating resulted in good correlation. Also, a simple resistance measurement was found to correlate as well with time to failure as pulse non-linearity. It was concluded that pulse non-linearity techniques are of limited usefulness as a reliability tool for all but those applications where severe joule heating is present.
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