Yu-Chi Huang, Hsin-Chao Chen, Tin-Jong Tai, Ke-Horng Chen
{"title":"双段平均(DSA)模数转换器(ADC)中的数字脉宽调制(DPWM) DC-DC转换器用于减少限环问题","authors":"Yu-Chi Huang, Hsin-Chao Chen, Tin-Jong Tai, Ke-Horng Chen","doi":"10.1109/ASSCC.2008.4708749","DOIUrl":null,"url":null,"abstract":"This paper proposes a dual-section average (DSA) analog-to-digital converter (ADC) to achieve a closed-loop digital pulse width modulation (DPWM) DC-DC converter with performance compatible to that by the analog PWM converter. For a 2.4 V input voltage, a regulated output voltage of 1.2 V can provide output current of 600 mA without any off-chip compensators. Besides, the output ripple can be reduced to about 8 mVp-p by theoretical result. The test chip was fabricated in 0.35 mum CMOS technology. Owing to the parasitic resistance, the output ripple of the experimental result is within 8 mVp-p. Furthermore, the transient recovery time is within 50 mus when load current changes from 120 mA to 600 mA, or vice versa.","PeriodicalId":143173,"journal":{"name":"2008 IEEE Asian Solid-State Circuits Conference","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Dual-section-average (DSA) analog-to-digital converter (ADC) in digital pulse width modulation (DPWM) DC-DC converter for reducing the problem of limiting cycle\",\"authors\":\"Yu-Chi Huang, Hsin-Chao Chen, Tin-Jong Tai, Ke-Horng Chen\",\"doi\":\"10.1109/ASSCC.2008.4708749\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a dual-section average (DSA) analog-to-digital converter (ADC) to achieve a closed-loop digital pulse width modulation (DPWM) DC-DC converter with performance compatible to that by the analog PWM converter. For a 2.4 V input voltage, a regulated output voltage of 1.2 V can provide output current of 600 mA without any off-chip compensators. Besides, the output ripple can be reduced to about 8 mVp-p by theoretical result. The test chip was fabricated in 0.35 mum CMOS technology. Owing to the parasitic resistance, the output ripple of the experimental result is within 8 mVp-p. Furthermore, the transient recovery time is within 50 mus when load current changes from 120 mA to 600 mA, or vice versa.\",\"PeriodicalId\":143173,\"journal\":{\"name\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2008.4708749\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2008.4708749","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dual-section-average (DSA) analog-to-digital converter (ADC) in digital pulse width modulation (DPWM) DC-DC converter for reducing the problem of limiting cycle
This paper proposes a dual-section average (DSA) analog-to-digital converter (ADC) to achieve a closed-loop digital pulse width modulation (DPWM) DC-DC converter with performance compatible to that by the analog PWM converter. For a 2.4 V input voltage, a regulated output voltage of 1.2 V can provide output current of 600 mA without any off-chip compensators. Besides, the output ripple can be reduced to about 8 mVp-p by theoretical result. The test chip was fabricated in 0.35 mum CMOS technology. Owing to the parasitic resistance, the output ripple of the experimental result is within 8 mVp-p. Furthermore, the transient recovery time is within 50 mus when load current changes from 120 mA to 600 mA, or vice versa.