D. Cox, David Leroy Guertin, C. Johnson, B. G. Rudolph, R. R. Williams, R. Piro, D. Stout
{"title":"芯片外驱动和时钟生成的VLSI性能补偿","authors":"D. Cox, David Leroy Guertin, C. Johnson, B. G. Rudolph, R. R. Williams, R. Piro, D. Stout","doi":"10.1109/CICC.1989.56752","DOIUrl":null,"url":null,"abstract":"A major problem in VLSI system design is controlling off-chip driver characteristics and skew in clock generation as process parameters, temperature, and supply voltage vary. A control circuit methodology has been developed that senses the relative performance of a CMOS chip and transmits a digitally encoded state to off-chip driver and clock generation circuits to control their operating characteristics","PeriodicalId":165054,"journal":{"name":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"VLSI performance compensation for off-chip drivers and clock generation\",\"authors\":\"D. Cox, David Leroy Guertin, C. Johnson, B. G. Rudolph, R. R. Williams, R. Piro, D. Stout\",\"doi\":\"10.1109/CICC.1989.56752\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A major problem in VLSI system design is controlling off-chip driver characteristics and skew in clock generation as process parameters, temperature, and supply voltage vary. A control circuit methodology has been developed that senses the relative performance of a CMOS chip and transmits a digitally encoded state to off-chip driver and clock generation circuits to control their operating characteristics\",\"PeriodicalId\":165054,\"journal\":{\"name\":\"1989 Proceedings of the IEEE Custom Integrated Circuits Conference\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1989 Proceedings of the IEEE Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.1989.56752\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1989.56752","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
VLSI performance compensation for off-chip drivers and clock generation
A major problem in VLSI system design is controlling off-chip driver characteristics and skew in clock generation as process parameters, temperature, and supply voltage vary. A control circuit methodology has been developed that senses the relative performance of a CMOS chip and transmits a digitally encoded state to off-chip driver and clock generation circuits to control their operating characteristics
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