处理巨磁阻记录磁头的静耗散镊子研究

C. F. Lam
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摘要

本文的目的是分享用于巨磁阻记录磁头的静态耗散镊子的研究信息。有两个测试,一个用于测量从镊子释放的瞬态电流的能量,另一个用于确定一对接地的镊子在接触时可能损坏GMR头的头框架组件(HGA)的电压。这些实验是重要的,因为从镊子释放的瞬态电流的能量直接影响GMR磁头的磁性能。这两项测试的结果比较吻合。大多数耗散陶瓷镊子的性能都很好。含有1.3%碳的黑色聚合物镊子和金属浸渍陶瓷镊子的性能也很好。一种类型的耗散共聚物镊子被发现表现得像导体。一些含碳聚合物镊子和不锈钢镊子的防静电性能最差。
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A study of static-dissipative tweezers for handling giant magneto-resistive recording heads
The goal of this paper is to share information on the study of static-dissipative tweezers for use in giant magneto-resistive recording heads. There are two tests, one to measure the amount of energy of transient currents discharged from tweezers and the other to determine the voltage of a head gimbal assembly (HGA) at which a pair of grounded tweezers can damage the GMR head when in contact. These experiments are important because the energy of transient current discharged from tweezers directly affects the magnetic performance of the GMR head. The results of the two tests correlate relatively well. Most dissipative ceramic tweezers performed very well. Black polymer tweezers with 1.3% carbon, and metal impregnated ceramic tweezers, also performed very well. One type of dissipative copolymer tweezers was found to behave like a conductor. Some carbon-loaded polymer tweezers and stainless steel tweezers have the worst ESD performances.
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ESD damage thresholds: history and prognosis [magnetic heads] Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors A study of static-dissipative tweezers for handling giant magneto-resistive recording heads A study of the mechanisms for ESD damage to reticles Floating gate EEPROM as EOS indicators during wafer-level GMR processing
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