在寄存器传输级别生成REGGEN-Test模式

Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI:10.1109/EURDAC.1993.410647

Andrej Magdolen, Jana Bezakova, E. Gramatová, M. Fischerová

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引用次数: 4

摘要

作者描述了在寄存器传输级别上的功能测试生成器REGGEN。采用新的规则对符号仿真技术进行了改进，简化了符号表达式。在REGGEN系统中，还实现了RT级的故障模拟器。REGGEN系统的有效性已经在多个门阵列上得到了验证。

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REGGEN-Test pattern generation on register transfer level

The authors describe the functional test generator REGGEN on a register transfer level. The technique of the symbolic simulation was modified by new rules to simplify symbolic expressions. In the REGGEN system a fault simulator at the RT level is also implemented. The efficiency of the REGGEN system has been proved on several gate arrays.<>

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Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference

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