{"title":"TM侧向泄漏在标准SOI光子学平台上的实验演示","authors":"A. Hope, T. Nguyen, W. Bogaerts, A. Mitchell","doi":"10.1109/GROUP4.2014.6962028","DOIUrl":null,"url":null,"abstract":"We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides.","PeriodicalId":364162,"journal":{"name":"11th International Conference on Group IV Photonics (GFP)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Experimental demonstration of TM lateral leakage in a standard SOI photonics platform\",\"authors\":\"A. Hope, T. Nguyen, W. Bogaerts, A. Mitchell\",\"doi\":\"10.1109/GROUP4.2014.6962028\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides.\",\"PeriodicalId\":364162,\"journal\":{\"name\":\"11th International Conference on Group IV Photonics (GFP)\",\"volume\":\"79 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Conference on Group IV Photonics (GFP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GROUP4.2014.6962028\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Conference on Group IV Photonics (GFP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GROUP4.2014.6962028","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental demonstration of TM lateral leakage in a standard SOI photonics platform
We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides.
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