{"title":"inp晶格匹配In1-x-yAlyGaxAs的修正折射率","authors":"P. Runge, S. Seifert","doi":"10.1109/CSW55288.2022.9930378","DOIUrl":null,"url":null,"abstract":"A generalized for the wavelength dependent refractive index in the transparent and absorbing SWIR wavelength regime of In<inf>1-x-y</inf>Al<inf>y</inf>Ga<inf>x</inf>As compound semiconductors is presented, being lattice-matched to InP. The model is derived from ellipsometric measurements of eight different In<inf>1-x-y</inf>Al<inf>y</inf>Ga<inf>x</inf>As grown semiconductor compositions.","PeriodicalId":382443,"journal":{"name":"2022 Compound Semiconductor Week (CSW)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Revised Refractive Index of InP-Lattice Matched In1-x-yAlyGaxAs\",\"authors\":\"P. Runge, S. Seifert\",\"doi\":\"10.1109/CSW55288.2022.9930378\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A generalized for the wavelength dependent refractive index in the transparent and absorbing SWIR wavelength regime of In<inf>1-x-y</inf>Al<inf>y</inf>Ga<inf>x</inf>As compound semiconductors is presented, being lattice-matched to InP. The model is derived from ellipsometric measurements of eight different In<inf>1-x-y</inf>Al<inf>y</inf>Ga<inf>x</inf>As grown semiconductor compositions.\",\"PeriodicalId\":382443,\"journal\":{\"name\":\"2022 Compound Semiconductor Week (CSW)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Compound Semiconductor Week (CSW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSW55288.2022.9930378\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Compound Semiconductor Week (CSW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSW55288.2022.9930378","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Revised Refractive Index of InP-Lattice Matched In1-x-yAlyGaxAs
A generalized for the wavelength dependent refractive index in the transparent and absorbing SWIR wavelength regime of In1-x-yAlyGaxAs compound semiconductors is presented, being lattice-matched to InP. The model is derived from ellipsometric measurements of eight different In1-x-yAlyGaxAs grown semiconductor compositions.
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