M. Von Thun, D. Walz, Radu Dumitru, Anthony L. Wilson, T. Farris
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SEU characterization of an embedded 130nm compiled SRAM in heavy ion and proton environments
Embedded Compiled SRAMs are included as part of the Cobham 130nm Radiation Hardened ASIC design environment. Previous testing of the Cobham 130nm library was performed at Lawrence Berkeley National Laboratory and is reported in the following references [1]–[4]. This work describes additional characterization of two architectures of compiled embedded SRAMs in heavy ion and proton environments. Heavy ion testing was performed at the Texas A&M University Cyclotron Institute (TAMU) and proton testing was performed at the TRI-University Meson Facility (TRIUMF).