嵌入式130nm编译SRAM在重离子和质子环境下的SEU表征

M. Von Thun, D. Walz, Radu Dumitru, Anthony L. Wilson, T. Farris
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引用次数: 1

摘要

嵌入式编译sram包括作为Cobham 130nm辐射硬化ASIC设计环境的一部分。Cobham 130nm文库的先前测试是在劳伦斯伯克利国家实验室进行的,并在以下参考文献[1]-[4]中报道。这项工作描述了在重离子和质子环境下编译嵌入式sram的两种架构的附加特征。重离子测试在德克萨斯A&M大学回旋加速器研究所(TAMU)进行,质子测试在TRI-University介子设施(TRIUMF)进行。
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SEU characterization of an embedded 130nm compiled SRAM in heavy ion and proton environments
Embedded Compiled SRAMs are included as part of the Cobham 130nm Radiation Hardened ASIC design environment. Previous testing of the Cobham 130nm library was performed at Lawrence Berkeley National Laboratory and is reported in the following references [1]–[4]. This work describes additional characterization of two architectures of compiled embedded SRAMs in heavy ion and proton environments. Heavy ion testing was performed at the Texas A&M University Cyclotron Institute (TAMU) and proton testing was performed at the TRI-University Meson Facility (TRIUMF).
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