低插入损耗10-110 GHz数字可调谐开关在22纳米FD-SOI CMOS

R. Ciocoveanu, R. Weigel, A. Hagelauer, V. Issakov
{"title":"低插入损耗10-110 GHz数字可调谐开关在22纳米FD-SOI CMOS","authors":"R. Ciocoveanu, R. Weigel, A. Hagelauer, V. Issakov","doi":"10.1109/BCICTS.2018.8550908","DOIUrl":null,"url":null,"abstract":"This paper presents a wideband digitally tunable SPST switch based on the travelling-wave concept that has been realized in a 22 nm FD-SOI CMOS technology. The digital control for return loss is performed through mutual inductance switching. Small-signal measurement results show that the proposed SPST switch achieves a bandwidth of 10–110 GHz, with an insertion loss of 1.2 dB at 60 GHz and a 24 dB isolation at 60 GHz, whereas large-signal measurements show a 1-dB compression point of +7 dBm at 24 GHz. Furthermore, the 3 digital control bits allow tuning return loss center frequency by approximately 7 GHz. The chip core size is $0.12\\ \\text{mm x}\\ 0.15\\ \\text{mm}$.","PeriodicalId":272808,"journal":{"name":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A Low Insertion-Loss 10–110 GHz Digitally Tunable SPST Switch in 22 nm FD-SOI CMOS\",\"authors\":\"R. Ciocoveanu, R. Weigel, A. Hagelauer, V. Issakov\",\"doi\":\"10.1109/BCICTS.2018.8550908\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a wideband digitally tunable SPST switch based on the travelling-wave concept that has been realized in a 22 nm FD-SOI CMOS technology. The digital control for return loss is performed through mutual inductance switching. Small-signal measurement results show that the proposed SPST switch achieves a bandwidth of 10–110 GHz, with an insertion loss of 1.2 dB at 60 GHz and a 24 dB isolation at 60 GHz, whereas large-signal measurements show a 1-dB compression point of +7 dBm at 24 GHz. Furthermore, the 3 digital control bits allow tuning return loss center frequency by approximately 7 GHz. The chip core size is $0.12\\\\ \\\\text{mm x}\\\\ 0.15\\\\ \\\\text{mm}$.\",\"PeriodicalId\":272808,\"journal\":{\"name\":\"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BCICTS.2018.8550908\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCICTS.2018.8550908","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

本文提出了一种基于行波概念的宽带数字可调谐SPST开关,该开关已在22 nm FD-SOI CMOS技术上实现。回程损耗的数字控制是通过互感开关实现的。小信号测量结果表明,该SPST交换机在60 GHz时的带宽为10-110 GHz,插入损耗为1.2 dB,隔离度为24 dB,而在24 GHz时的大信号测量结果显示1 dB压缩点为+7 dBm。此外,3个数字控制位允许调谐回波损耗中心频率约7 GHz。芯片核心尺寸为$0.12\ \text{mm x}\ 0.15\ text{mm}$。
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A Low Insertion-Loss 10–110 GHz Digitally Tunable SPST Switch in 22 nm FD-SOI CMOS
This paper presents a wideband digitally tunable SPST switch based on the travelling-wave concept that has been realized in a 22 nm FD-SOI CMOS technology. The digital control for return loss is performed through mutual inductance switching. Small-signal measurement results show that the proposed SPST switch achieves a bandwidth of 10–110 GHz, with an insertion loss of 1.2 dB at 60 GHz and a 24 dB isolation at 60 GHz, whereas large-signal measurements show a 1-dB compression point of +7 dBm at 24 GHz. Furthermore, the 3 digital control bits allow tuning return loss center frequency by approximately 7 GHz. The chip core size is $0.12\ \text{mm x}\ 0.15\ \text{mm}$.
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