{"title":"利用背通效应的模拟应用中独立门finfet的射频灵敏度分析","authors":"A. M. Bughio, S. Guerrieri, F. Bonani, G. Ghione","doi":"10.23919/EUMIC.2017.8230708","DOIUrl":null,"url":null,"abstract":"In this paper the sensitivity of FinFETs AC performances vs. variations of various physical parameters is analyzed at varying bias, and in particular with Independent Gates (IG) bias chosen to exploit the unique back-gating properties of these multi-gate devices. Sensitivity charts, extracted through a numerically efficient, yet accurate, physics-based TCAD simulation method, are identified as a valuable design tool for the sensitivity aware development of RF building blocks.","PeriodicalId":120932,"journal":{"name":"2017 12th European Microwave Integrated Circuits Conference (EuMIC)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"RF sensitivity analysis of independent-gates FinFETs for analog applications exploiting the back-gating effect\",\"authors\":\"A. M. Bughio, S. Guerrieri, F. Bonani, G. Ghione\",\"doi\":\"10.23919/EUMIC.2017.8230708\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the sensitivity of FinFETs AC performances vs. variations of various physical parameters is analyzed at varying bias, and in particular with Independent Gates (IG) bias chosen to exploit the unique back-gating properties of these multi-gate devices. Sensitivity charts, extracted through a numerically efficient, yet accurate, physics-based TCAD simulation method, are identified as a valuable design tool for the sensitivity aware development of RF building blocks.\",\"PeriodicalId\":120932,\"journal\":{\"name\":\"2017 12th European Microwave Integrated Circuits Conference (EuMIC)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 12th European Microwave Integrated Circuits Conference (EuMIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EUMIC.2017.8230708\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 12th European Microwave Integrated Circuits Conference (EuMIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EUMIC.2017.8230708","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF sensitivity analysis of independent-gates FinFETs for analog applications exploiting the back-gating effect
In this paper the sensitivity of FinFETs AC performances vs. variations of various physical parameters is analyzed at varying bias, and in particular with Independent Gates (IG) bias chosen to exploit the unique back-gating properties of these multi-gate devices. Sensitivity charts, extracted through a numerically efficient, yet accurate, physics-based TCAD simulation method, are identified as a valuable design tool for the sensitivity aware development of RF building blocks.
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