T. Blank, B. Leyrer, T. Maurer, M. Meisser, M. Bruns, M. Weber
{"title":"电力电子用铜厚膜衬底","authors":"T. Blank, B. Leyrer, T. Maurer, M. Meisser, M. Bruns, M. Weber","doi":"10.1109/ESTC.2014.6962860","DOIUrl":null,"url":null,"abstract":"Substrates for high power electronic systems are dominated by DCB-technology. Recently, new copper thick-film pastes have been proposed for use as high power substrates. They are compatible with Al2O3- and pre-oxised AlN-substrates. This paper investigates production processes to build up highly reliable power modules and explores basis electrical and thermal properties of thick-film copper substrates. Fired copper film thicknesses of 300 μm have been produced by subsequent print-dry-fire cycles. Smooth surfaces and copper films with a density of about 70 % of bulk copper have been produced. A power module comprising of 650 V IGBTs, diodes and an intelligent hall sensor with copper traces and spaces of 200 μm is presented. Wire bonding processes on copper thick-films with 500 μm aluminium wire and 400 μm copper wire are discussed. Test units with a 1200 V IGBT were built up. The IGBT was attached at 250 °C and a pressure of 15 MPa using a novel silver sinter paste. This paste can be directly used on copper. The current-carrying capacity of the thick-film test samples was found to be reduced by 10% in comparison to the DCB test device. No significant difference was found in the performance of both technologies in active power pulse tests lasting a few seconds. The number of cycles for test devices with sintered chips, bonded with 400 μm copper wire bonds exceeded 450,000 cycles in a cycles from 25 °C up to 150 °C.","PeriodicalId":299981,"journal":{"name":"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Copper thick-film substrates for power electronic applications\",\"authors\":\"T. Blank, B. Leyrer, T. Maurer, M. Meisser, M. Bruns, M. Weber\",\"doi\":\"10.1109/ESTC.2014.6962860\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Substrates for high power electronic systems are dominated by DCB-technology. Recently, new copper thick-film pastes have been proposed for use as high power substrates. They are compatible with Al2O3- and pre-oxised AlN-substrates. This paper investigates production processes to build up highly reliable power modules and explores basis electrical and thermal properties of thick-film copper substrates. Fired copper film thicknesses of 300 μm have been produced by subsequent print-dry-fire cycles. Smooth surfaces and copper films with a density of about 70 % of bulk copper have been produced. A power module comprising of 650 V IGBTs, diodes and an intelligent hall sensor with copper traces and spaces of 200 μm is presented. Wire bonding processes on copper thick-films with 500 μm aluminium wire and 400 μm copper wire are discussed. Test units with a 1200 V IGBT were built up. The IGBT was attached at 250 °C and a pressure of 15 MPa using a novel silver sinter paste. This paste can be directly used on copper. The current-carrying capacity of the thick-film test samples was found to be reduced by 10% in comparison to the DCB test device. No significant difference was found in the performance of both technologies in active power pulse tests lasting a few seconds. The number of cycles for test devices with sintered chips, bonded with 400 μm copper wire bonds exceeded 450,000 cycles in a cycles from 25 °C up to 150 °C.\",\"PeriodicalId\":299981,\"journal\":{\"name\":\"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTC.2014.6962860\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2014.6962860","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Copper thick-film substrates for power electronic applications
Substrates for high power electronic systems are dominated by DCB-technology. Recently, new copper thick-film pastes have been proposed for use as high power substrates. They are compatible with Al2O3- and pre-oxised AlN-substrates. This paper investigates production processes to build up highly reliable power modules and explores basis electrical and thermal properties of thick-film copper substrates. Fired copper film thicknesses of 300 μm have been produced by subsequent print-dry-fire cycles. Smooth surfaces and copper films with a density of about 70 % of bulk copper have been produced. A power module comprising of 650 V IGBTs, diodes and an intelligent hall sensor with copper traces and spaces of 200 μm is presented. Wire bonding processes on copper thick-films with 500 μm aluminium wire and 400 μm copper wire are discussed. Test units with a 1200 V IGBT were built up. The IGBT was attached at 250 °C and a pressure of 15 MPa using a novel silver sinter paste. This paste can be directly used on copper. The current-carrying capacity of the thick-film test samples was found to be reduced by 10% in comparison to the DCB test device. No significant difference was found in the performance of both technologies in active power pulse tests lasting a few seconds. The number of cycles for test devices with sintered chips, bonded with 400 μm copper wire bonds exceeded 450,000 cycles in a cycles from 25 °C up to 150 °C.