{"title":"一种新型线性测量光学电压传感器","authors":"Xian Su, Qifeng Xu, Hao Chen","doi":"10.1109/ICAM.2017.8242157","DOIUrl":null,"url":null,"abstract":"An OVT based on Mach-Zehnder interferometer is proposed in this paper, which helps to convert the electro-optic phase delay into the displacement of the interference fringe. And then, the voltage applied to the electro-optic crystal is obtained by positioning the displacement of the fringe, and the effectiveness of this method is verified by experiments. The new OVT meets the requirements of 0.5% accuracy class. And it has advantages of direct linear measurement, independent of light intensity and no limit by half wave voltage of crystal in measurement range. Moreover the new OVT is simple and easy to be built up.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A new optical voltage sensor for linear measurement\",\"authors\":\"Xian Su, Qifeng Xu, Hao Chen\",\"doi\":\"10.1109/ICAM.2017.8242157\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An OVT based on Mach-Zehnder interferometer is proposed in this paper, which helps to convert the electro-optic phase delay into the displacement of the interference fringe. And then, the voltage applied to the electro-optic crystal is obtained by positioning the displacement of the fringe, and the effectiveness of this method is verified by experiments. The new OVT meets the requirements of 0.5% accuracy class. And it has advantages of direct linear measurement, independent of light intensity and no limit by half wave voltage of crystal in measurement range. Moreover the new OVT is simple and easy to be built up.\",\"PeriodicalId\":117801,\"journal\":{\"name\":\"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICAM.2017.8242157\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICAM.2017.8242157","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new optical voltage sensor for linear measurement
An OVT based on Mach-Zehnder interferometer is proposed in this paper, which helps to convert the electro-optic phase delay into the displacement of the interference fringe. And then, the voltage applied to the electro-optic crystal is obtained by positioning the displacement of the fringe, and the effectiveness of this method is verified by experiments. The new OVT meets the requirements of 0.5% accuracy class. And it has advantages of direct linear measurement, independent of light intensity and no limit by half wave voltage of crystal in measurement range. Moreover the new OVT is simple and easy to be built up.
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