固态硬盘长期可靠性的无排油热间隙填料

Vigneshwarram Kumaresan, M. Devarajan
{"title":"固态硬盘长期可靠性的无排油热间隙填料","authors":"Vigneshwarram Kumaresan, M. Devarajan","doi":"10.1109/ectc51906.2022.00201","DOIUrl":null,"url":null,"abstract":"Liquid thermal gap fillers play a vital role in dissipating heat from electronic components to enclosure surfaces. However, oil bleed from silicone-based liquid thermal gap filler causes contamination on enclosure substrates. It is essential to develop a non-oil bleed, thermally reliable thermal gap filler for solid state drive (SSD). In this work, a novel two-part thermal gap filler was synthesized. The long-term stability and reliability of thermal gap filler were evaluated using a highly accelerated temperature and humidity stress test (HAST). Thermal conductivity of cured thermal gap fillers were investigated before and after HAST. It was found that newly formulated thermal gap filler was stable even at high temperature and high humidity environments. Thus, the newly formulated thermal gap filler can effectively dissipate heat and enhance the performance and reliability of SSD.","PeriodicalId":139520,"journal":{"name":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","volume":"1122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Non-oil bleed thermal gap fillers for long-term reliability of Solid State Drive\",\"authors\":\"Vigneshwarram Kumaresan, M. Devarajan\",\"doi\":\"10.1109/ectc51906.2022.00201\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Liquid thermal gap fillers play a vital role in dissipating heat from electronic components to enclosure surfaces. However, oil bleed from silicone-based liquid thermal gap filler causes contamination on enclosure substrates. It is essential to develop a non-oil bleed, thermally reliable thermal gap filler for solid state drive (SSD). In this work, a novel two-part thermal gap filler was synthesized. The long-term stability and reliability of thermal gap filler were evaluated using a highly accelerated temperature and humidity stress test (HAST). Thermal conductivity of cured thermal gap fillers were investigated before and after HAST. It was found that newly formulated thermal gap filler was stable even at high temperature and high humidity environments. Thus, the newly formulated thermal gap filler can effectively dissipate heat and enhance the performance and reliability of SSD.\",\"PeriodicalId\":139520,\"journal\":{\"name\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"volume\":\"1122 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ectc51906.2022.00201\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc51906.2022.00201","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

液体热间隙填充物在从电子元件到外壳表面散热方面起着至关重要的作用。然而,从硅基液体热间隙填料中渗出的油会对外壳基材造成污染。开发一种无漏油、热可靠的固态硬盘热间隙填料是十分必要的。本文合成了一种新型的两组分热隙填充剂。采用高加速温湿应力试验(HAST)对热隙填料的长期稳定性和可靠性进行了评价。研究了固化热间隙填料在采用HAST技术前后的导热性能。结果表明,新制备的热间隙填料在高温高湿环境下也能保持稳定。因此,新配制的热隙填充剂可以有效地散热,提高SSD的性能和可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Non-oil bleed thermal gap fillers for long-term reliability of Solid State Drive
Liquid thermal gap fillers play a vital role in dissipating heat from electronic components to enclosure surfaces. However, oil bleed from silicone-based liquid thermal gap filler causes contamination on enclosure substrates. It is essential to develop a non-oil bleed, thermally reliable thermal gap filler for solid state drive (SSD). In this work, a novel two-part thermal gap filler was synthesized. The long-term stability and reliability of thermal gap filler were evaluated using a highly accelerated temperature and humidity stress test (HAST). Thermal conductivity of cured thermal gap fillers were investigated before and after HAST. It was found that newly formulated thermal gap filler was stable even at high temperature and high humidity environments. Thus, the newly formulated thermal gap filler can effectively dissipate heat and enhance the performance and reliability of SSD.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Transient Thermal Modeling of Die Bond Process in Multiple Die Stacked Flash Memory Package Development and Application of the Moisture-Dependent Viscoelastic Model of Polyimide in Hygro-Thermo-Mechanical Analysis of Fan-Out Interconnect Superb sinterability of the Cu paste consisting of bimodal size distribution Cu nanoparticles for low-temperature and pressureless sintering of large-area die attachment and the sintering mechanism Demonstration of Substrate Embedded Ni-Zn Ferrite Core Solenoid Inductors Using a Photosensitive Glass Substrate A De-Embedding and Embedding Procedure for High-Speed Channel Eye Diagram Oscilloscope Measurement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1