Kai Ni, Jeffrey A. Smith, B. Grisafe, Titash Rakshit, Borna Obradovic, Jorge A. Kittl, Mark S. Rodder, S. Datta
{"title":"用于神经形态应用的SoC逻辑兼容多位FeMFET权重单元","authors":"Kai Ni, Jeffrey A. Smith, B. Grisafe, Titash Rakshit, Borna Obradovic, Jorge A. Kittl, Mark S. Rodder, S. Datta","doi":"10.1109/IEDM.2018.8614496","DOIUrl":null,"url":null,"abstract":"We demonstrate an SoC logic compatible ferroelectric-metal field effect transistor (FeMFET) digital 2-bit weight cell by monolithic BEOL integration of a ferroelectric (FE) capacitor with the gate of a conventional Si HK/MG MOSFET. Through optimization of the area ratio between the FE capacitor and the MOSFET, we show: 1) program/erase write voltages can be scaled down to logic compatible level, ±1.8 V, simplifying write circuitry; 2) write speed of 100ns; 3) write endurance $> 10^{10}$ cycles without degradation due to elimination of charge trapping in FE; 4) 2 bits/cell achieving software levels of accuracy for inference on MNIST training database; 5) state retention approaching 104 s for a depolarization field of 0.3 MV/cm; 6) Multi-port (independent read and write) operations.","PeriodicalId":152963,"journal":{"name":"2018 IEEE International Electron Devices Meeting (IEDM)","volume":"175 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"65","resultStr":"{\"title\":\"SoC Logic Compatible Multi-Bit FeMFET Weight Cell for Neuromorphic Applications\",\"authors\":\"Kai Ni, Jeffrey A. Smith, B. Grisafe, Titash Rakshit, Borna Obradovic, Jorge A. Kittl, Mark S. Rodder, S. Datta\",\"doi\":\"10.1109/IEDM.2018.8614496\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate an SoC logic compatible ferroelectric-metal field effect transistor (FeMFET) digital 2-bit weight cell by monolithic BEOL integration of a ferroelectric (FE) capacitor with the gate of a conventional Si HK/MG MOSFET. Through optimization of the area ratio between the FE capacitor and the MOSFET, we show: 1) program/erase write voltages can be scaled down to logic compatible level, ±1.8 V, simplifying write circuitry; 2) write speed of 100ns; 3) write endurance $> 10^{10}$ cycles without degradation due to elimination of charge trapping in FE; 4) 2 bits/cell achieving software levels of accuracy for inference on MNIST training database; 5) state retention approaching 104 s for a depolarization field of 0.3 MV/cm; 6) Multi-port (independent read and write) operations.\",\"PeriodicalId\":152963,\"journal\":{\"name\":\"2018 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"175 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"65\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2018.8614496\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2018.8614496","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SoC Logic Compatible Multi-Bit FeMFET Weight Cell for Neuromorphic Applications
We demonstrate an SoC logic compatible ferroelectric-metal field effect transistor (FeMFET) digital 2-bit weight cell by monolithic BEOL integration of a ferroelectric (FE) capacitor with the gate of a conventional Si HK/MG MOSFET. Through optimization of the area ratio between the FE capacitor and the MOSFET, we show: 1) program/erase write voltages can be scaled down to logic compatible level, ±1.8 V, simplifying write circuitry; 2) write speed of 100ns; 3) write endurance $> 10^{10}$ cycles without degradation due to elimination of charge trapping in FE; 4) 2 bits/cell achieving software levels of accuracy for inference on MNIST training database; 5) state retention approaching 104 s for a depolarization field of 0.3 MV/cm; 6) Multi-port (independent read and write) operations.