利用声发射法对模具附着结构劣化进行实时监测与诊断

Zheng Zhang, A. Suetake, Chuantong Chen, O. Katayama, H. Ishino, Takeshi Endo, K. Sugiura, K. Tsuruta, K. Suganuma
{"title":"利用声发射法对模具附着结构劣化进行实时监测与诊断","authors":"Zheng Zhang, A. Suetake, Chuantong Chen, O. Katayama, H. Ishino, Takeshi Endo, K. Sugiura, K. Tsuruta, K. Suganuma","doi":"10.23919/ICEP55381.2022.9795523","DOIUrl":null,"url":null,"abstract":"In this work, we assembled thermal cycling equipment by a halogen lamp heater and applied the acoustic emission (AE) technique to real-time monitor and diagnose the health state of die attach structures used in power electronics. The assembled equipment is able to execute a cycling environment with a temperature variation from room temperature to 165 °C. Meanwhile, AE monitoring can be applied at the same time to real-time diagnose the health condition of a die attach structure. A soldered die attach structure was tested by 10000 cycles on this platform. AE signals were acquired during the cycling test, which originated from solder layer cracks that were confirmed by scanning acoustic tomography observations. This platform shows a superior specialty in detecting cracking of solder layer due to the high sensitivity of AE monitoring. Meanwhile, the cumulative AE counts that indicate the degree of cracking can be an important indication for diagnosing the health condition of the die attach structure.","PeriodicalId":413776,"journal":{"name":"2022 International Conference on Electronics Packaging (ICEP)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Real-time monitoring and diagnosis of die attach structure deterioration by using acoustic emission method\",\"authors\":\"Zheng Zhang, A. Suetake, Chuantong Chen, O. Katayama, H. Ishino, Takeshi Endo, K. Sugiura, K. Tsuruta, K. Suganuma\",\"doi\":\"10.23919/ICEP55381.2022.9795523\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we assembled thermal cycling equipment by a halogen lamp heater and applied the acoustic emission (AE) technique to real-time monitor and diagnose the health state of die attach structures used in power electronics. The assembled equipment is able to execute a cycling environment with a temperature variation from room temperature to 165 °C. Meanwhile, AE monitoring can be applied at the same time to real-time diagnose the health condition of a die attach structure. A soldered die attach structure was tested by 10000 cycles on this platform. AE signals were acquired during the cycling test, which originated from solder layer cracks that were confirmed by scanning acoustic tomography observations. This platform shows a superior specialty in detecting cracking of solder layer due to the high sensitivity of AE monitoring. Meanwhile, the cumulative AE counts that indicate the degree of cracking can be an important indication for diagnosing the health condition of the die attach structure.\",\"PeriodicalId\":413776,\"journal\":{\"name\":\"2022 International Conference on Electronics Packaging (ICEP)\",\"volume\":\"146 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ICEP55381.2022.9795523\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP55381.2022.9795523","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文采用卤素灯加热器组装热循环装置,利用声发射技术实时监测和诊断电力电子产品中模具附着结构的健康状态。组装的设备能够执行从室温到165°C的温度变化的循环环境。同时,声发射监测可以实时诊断模具附着结构的健康状况。在此平台上对焊模连接结构进行了10000次循环试验。在循环测试中获得了声发射信号,这些信号来自于通过扫描声断层扫描观察到的焊接层裂纹。由于声发射监测的高灵敏度,该平台在检测焊料层裂纹方面表现出优越的专业性。同时,表明裂纹程度的累积声发射计数可以作为诊断模具附着结构健康状况的重要指标。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Real-time monitoring and diagnosis of die attach structure deterioration by using acoustic emission method
In this work, we assembled thermal cycling equipment by a halogen lamp heater and applied the acoustic emission (AE) technique to real-time monitor and diagnose the health state of die attach structures used in power electronics. The assembled equipment is able to execute a cycling environment with a temperature variation from room temperature to 165 °C. Meanwhile, AE monitoring can be applied at the same time to real-time diagnose the health condition of a die attach structure. A soldered die attach structure was tested by 10000 cycles on this platform. AE signals were acquired during the cycling test, which originated from solder layer cracks that were confirmed by scanning acoustic tomography observations. This platform shows a superior specialty in detecting cracking of solder layer due to the high sensitivity of AE monitoring. Meanwhile, the cumulative AE counts that indicate the degree of cracking can be an important indication for diagnosing the health condition of the die attach structure.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Strain-Induced Change in the Photonic Properties of Dumbbell-Shaped Graphene Nanoribbon Structures Terminal Reaction Behaviors in Micro Bumps: Comparison of Ti and Cr Adhesion Layers Low temperature interconnects in 1st level packaging and its challenges Advanced Low Dk and High-Density Photo- Imageable Dielectrics for RDL Interposer Low-Temperature Chemical Vapor Deposition of SiCN for Hybrid Bonding
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1