J. Bickel, M. Schneider-Ramelow, K.-D. Lang, R. Gesche, H. Ngo
{"title":"使用大气压溅射的恶劣环境应用的铂互连","authors":"J. Bickel, M. Schneider-Ramelow, K.-D. Lang, R. Gesche, H. Ngo","doi":"10.23919/ICEP55381.2022.9795437","DOIUrl":null,"url":null,"abstract":"For the atmospheric pressure sputtering technology, directly structured thin- and highly conductive layers of platinum were additively deposited on Al2O3 ceramic substrate. The necessary process parameters could be identified and the layers could be contacted by using thin-wire bonding. A subsequent storage for 10 h at 500 °C shows no degeneration of the mechanical bonding properties.","PeriodicalId":413776,"journal":{"name":"2022 International Conference on Electronics Packaging (ICEP)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Platinum interconnections for harsh environment applications using atmospheric pressure sputtering\",\"authors\":\"J. Bickel, M. Schneider-Ramelow, K.-D. Lang, R. Gesche, H. Ngo\",\"doi\":\"10.23919/ICEP55381.2022.9795437\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For the atmospheric pressure sputtering technology, directly structured thin- and highly conductive layers of platinum were additively deposited on Al2O3 ceramic substrate. The necessary process parameters could be identified and the layers could be contacted by using thin-wire bonding. A subsequent storage for 10 h at 500 °C shows no degeneration of the mechanical bonding properties.\",\"PeriodicalId\":413776,\"journal\":{\"name\":\"2022 International Conference on Electronics Packaging (ICEP)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ICEP55381.2022.9795437\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP55381.2022.9795437","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Platinum interconnections for harsh environment applications using atmospheric pressure sputtering
For the atmospheric pressure sputtering technology, directly structured thin- and highly conductive layers of platinum were additively deposited on Al2O3 ceramic substrate. The necessary process parameters could be identified and the layers could be contacted by using thin-wire bonding. A subsequent storage for 10 h at 500 °C shows no degeneration of the mechanical bonding properties.