用集成电路带状线法分析压控振荡器的辐射电磁抗扰度

JongTae Hwang, Youngbong Han, Hyunho Park, W. Nah, Soyoung Kim
{"title":"用集成电路带状线法分析压控振荡器的辐射电磁抗扰度","authors":"JongTae Hwang, Youngbong Han, Hyunho Park, W. Nah, Soyoung Kim","doi":"10.1109/EMCCOMPO.2015.7358347","DOIUrl":null,"url":null,"abstract":"As system integration in wireless portable electronic devices has increased significantly, the analysis of electromagnetic compatibility (EMC) has become important to prevent the malfunction of integrated circuits (ICs). To evaluate the radiative immunity of an integrated circuit, we employ the IEC-standardized IC stripline method. In this paper, we provide an electromagnetic immunity analysis of the radiated electromagnetic noise coupling from an IC stripline to a ring voltage-controlled oscillator (VCO). We present the design of an IC stripline that meets the IEC 62132-8 standard, the test setup and the experimental results of the VCO test chip. The measurement shows that the radio frequency (RF) source from the IC stripline causes changes in the center frequency and output characteristics. VCO output variations show that the design is relatively immune to radiated noise of the same frequency as the oscillator output, and the output frequency spectrum spreads out more with higher noise amplitude due to injection. The experiment shows that the IC stripline method is an effective solution for the radiated electromagnetic analysis of an IC.","PeriodicalId":236992,"journal":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Radiated electromagnetic immunity analysis of VCO using IC stripline method\",\"authors\":\"JongTae Hwang, Youngbong Han, Hyunho Park, W. Nah, Soyoung Kim\",\"doi\":\"10.1109/EMCCOMPO.2015.7358347\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As system integration in wireless portable electronic devices has increased significantly, the analysis of electromagnetic compatibility (EMC) has become important to prevent the malfunction of integrated circuits (ICs). To evaluate the radiative immunity of an integrated circuit, we employ the IEC-standardized IC stripline method. In this paper, we provide an electromagnetic immunity analysis of the radiated electromagnetic noise coupling from an IC stripline to a ring voltage-controlled oscillator (VCO). We present the design of an IC stripline that meets the IEC 62132-8 standard, the test setup and the experimental results of the VCO test chip. The measurement shows that the radio frequency (RF) source from the IC stripline causes changes in the center frequency and output characteristics. VCO output variations show that the design is relatively immune to radiated noise of the same frequency as the oscillator output, and the output frequency spectrum spreads out more with higher noise amplitude due to injection. The experiment shows that the IC stripline method is an effective solution for the radiated electromagnetic analysis of an IC.\",\"PeriodicalId\":236992,\"journal\":{\"name\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"101 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2015.7358347\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2015.7358347","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

随着无线便携式电子设备系统集成度的显著提高,电磁兼容性(EMC)分析对于防止集成电路(ic)故障变得非常重要。为了评估集成电路的辐射抗扰度,我们采用了iec标准的集成电路带状线方法。在本文中,我们提供了从IC带状线到环形压控振荡器(VCO)辐射电磁噪声耦合的电磁抗扰度分析。本文设计了一种符合IEC 62132-8标准的集成电路带状线,并给出了VCO测试芯片的测试装置和实验结果。测量结果表明,来自IC带状线的射频(RF)源引起中心频率和输出特性的变化。VCO输出的变化表明,该设计相对不受与振荡器输出相同频率的辐射噪声的影响,并且由于注入,输出频谱的扩张性更强,噪声幅值更高。实验表明,集成电路带状线法是集成电路辐射电磁分析的有效解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Radiated electromagnetic immunity analysis of VCO using IC stripline method
As system integration in wireless portable electronic devices has increased significantly, the analysis of electromagnetic compatibility (EMC) has become important to prevent the malfunction of integrated circuits (ICs). To evaluate the radiative immunity of an integrated circuit, we employ the IEC-standardized IC stripline method. In this paper, we provide an electromagnetic immunity analysis of the radiated electromagnetic noise coupling from an IC stripline to a ring voltage-controlled oscillator (VCO). We present the design of an IC stripline that meets the IEC 62132-8 standard, the test setup and the experimental results of the VCO test chip. The measurement shows that the radio frequency (RF) source from the IC stripline causes changes in the center frequency and output characteristics. VCO output variations show that the design is relatively immune to radiated noise of the same frequency as the oscillator output, and the output frequency spectrum spreads out more with higher noise amplitude due to injection. The experiment shows that the IC stripline method is an effective solution for the radiated electromagnetic analysis of an IC.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Near-field injection on a Safe System Basis Chip at silicon level On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions Functional analysis of an integrated communication interface during ESD DPI set-up for ICs with differential inputs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1