{"title":"跳频技术降低DC-DC变换器电磁干扰的实验研究","authors":"H. Huynh, S. Joo, Soyoung Kim","doi":"10.1109/EDAPS.2016.7893138","DOIUrl":null,"url":null,"abstract":"In this paper, the EMI problem of the DC-DC converter is discussed. The power spectrums of the DC-DC converter's nodes are analyzed and the noise scanner method is used to prove that the switching node of the DC-DC converter is the dominant source of EMI. To reduce EMI of DC-DC converters, frequency hopping technique can be applied. The DC-DC converter with frequency hopping technique is fabricated using 180nm CMOS process. The test chip results by IC-stripline and noise scanner methods show a significant improvement in EMI. The EMI reduction amount is 6.87 dB at fundamental switching frequency by applying the frequency hopping technique with IC-stripline measurement.","PeriodicalId":191549,"journal":{"name":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","volume":"159 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"An experimental study of EMI reduction of DC-DC converter with frequency hopping technique\",\"authors\":\"H. Huynh, S. Joo, Soyoung Kim\",\"doi\":\"10.1109/EDAPS.2016.7893138\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the EMI problem of the DC-DC converter is discussed. The power spectrums of the DC-DC converter's nodes are analyzed and the noise scanner method is used to prove that the switching node of the DC-DC converter is the dominant source of EMI. To reduce EMI of DC-DC converters, frequency hopping technique can be applied. The DC-DC converter with frequency hopping technique is fabricated using 180nm CMOS process. The test chip results by IC-stripline and noise scanner methods show a significant improvement in EMI. The EMI reduction amount is 6.87 dB at fundamental switching frequency by applying the frequency hopping technique with IC-stripline measurement.\",\"PeriodicalId\":191549,\"journal\":{\"name\":\"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"volume\":\"159 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS.2016.7893138\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2016.7893138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An experimental study of EMI reduction of DC-DC converter with frequency hopping technique
In this paper, the EMI problem of the DC-DC converter is discussed. The power spectrums of the DC-DC converter's nodes are analyzed and the noise scanner method is used to prove that the switching node of the DC-DC converter is the dominant source of EMI. To reduce EMI of DC-DC converters, frequency hopping technique can be applied. The DC-DC converter with frequency hopping technique is fabricated using 180nm CMOS process. The test chip results by IC-stripline and noise scanner methods show a significant improvement in EMI. The EMI reduction amount is 6.87 dB at fundamental switching frequency by applying the frequency hopping technique with IC-stripline measurement.
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