{"title":"表面处理对cdznese辐射探测器性能的影响","authors":"L. Martínez-Herraiz, E. Ruiz, A. Braña, J. Plaza","doi":"10.1109/CDE52135.2021.9455744","DOIUrl":null,"url":null,"abstract":"In the present study, I-V curves and EFM-Phase measurement for surface polishing treatments are used in order to obtain electrical properties like breakdown voltages, leakage currents and Schottky Diode Barrier Height (SBH) calculated by Thermionic Emission model (TE) and parabolic model of EFM-Phase. The results showed that a polishing treatment with 0.03 μm grain size alumina powder solution induces a higher SBH, lower leakage current and higher breakdown voltage compared to that with 1 μm alumina solution.","PeriodicalId":267404,"journal":{"name":"2021 13th Spanish Conference on Electron Devices (CDE)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effects of Surface Treatments on the Performance of CdZnTeSe Radiation Detectors\",\"authors\":\"L. Martínez-Herraiz, E. Ruiz, A. Braña, J. Plaza\",\"doi\":\"10.1109/CDE52135.2021.9455744\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the present study, I-V curves and EFM-Phase measurement for surface polishing treatments are used in order to obtain electrical properties like breakdown voltages, leakage currents and Schottky Diode Barrier Height (SBH) calculated by Thermionic Emission model (TE) and parabolic model of EFM-Phase. The results showed that a polishing treatment with 0.03 μm grain size alumina powder solution induces a higher SBH, lower leakage current and higher breakdown voltage compared to that with 1 μm alumina solution.\",\"PeriodicalId\":267404,\"journal\":{\"name\":\"2021 13th Spanish Conference on Electron Devices (CDE)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 13th Spanish Conference on Electron Devices (CDE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CDE52135.2021.9455744\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 13th Spanish Conference on Electron Devices (CDE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CDE52135.2021.9455744","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effects of Surface Treatments on the Performance of CdZnTeSe Radiation Detectors
In the present study, I-V curves and EFM-Phase measurement for surface polishing treatments are used in order to obtain electrical properties like breakdown voltages, leakage currents and Schottky Diode Barrier Height (SBH) calculated by Thermionic Emission model (TE) and parabolic model of EFM-Phase. The results showed that a polishing treatment with 0.03 μm grain size alumina powder solution induces a higher SBH, lower leakage current and higher breakdown voltage compared to that with 1 μm alumina solution.
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