有效分组故障芯片的产量诊断

2009 22nd International Conference on VLSI Design Pub Date : 2009-01-05 DOI:10.1109/VLSI.Design.2009.59

Lavanya Jagan, Ratan Deep Singh, V. Kamakoti, A. Majhi

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引用次数: 2

摘要

体积良率诊断(VYD)对于诊断关键的系统良率问题至关重要，可以从测试数千个芯片获得的报告中进行诊断。本文提出了一种有效的VYD聚类技术，该技术在仿真环境和实际工业故障数据上都取得了成功。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Efficient Grouping of Fail Chips for Volume Yield Diagnostics

Volume Yield Diagnostics (VYD) is crucial to diagnose critical systematic yield issues from the reports obtained by testing thousands of chips. This paper presents an efficient clustering technique for VYD that has been shown to work successfully both in the simulation environment as well as on real industrial failure data.

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2009 22nd International Conference on VLSI Design

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