用于低地球轨道和深空应用的商用现货和标准电子产品的单事件效应试验结果汇编

2017 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2017-07-17 DOI:10.1109/NSREC.2017.8115433

B. Reddell, C. Bailey, P. O'Neill, K. Nguyen, S. Wheeler, R. Gaza, Chirag Patel, J. Cooper, Theodore Kalb, E. Beach, L. Mason

{"title":"用于低地球轨道和深空应用的商用现货和标准电子产品的单事件效应试验结果汇编","authors":"B. Reddell, C. Bailey, P. O'Neill, K. Nguyen, S. Wheeler, R. Gaza, Chirag Patel, J. Cooper, Theodore Kalb, E. Beach, L. Mason","doi":"10.1109/NSREC.2017.8115433","DOIUrl":null,"url":null,"abstract":"We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications\",\"authors\":\"B. Reddell, C. Bailey, P. O'Neill, K. Nguyen, S. Wheeler, R. Gaza, Chirag Patel, J. Cooper, Theodore Kalb, E. Beach, L. Mason\",\"doi\":\"10.1109/NSREC.2017.8115433\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115433\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115433","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 8

摘要

我们提出了用于低地球轨道(LEO)和深空应用的电子元件的高能质子和低能和高能重离子的单事件效应(SEE)测试结果。

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Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications

We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.

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2017 IEEE Radiation Effects Data Workshop (REDW)

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