板级包装中的热机械可再加工环氧底料:材料特性和可靠性标准

Saw Lip Teng, M. Devarajan
{"title":"板级包装中的热机械可再加工环氧底料:材料特性和可靠性标准","authors":"Saw Lip Teng, M. Devarajan","doi":"10.1109/ectc51906.2022.00275","DOIUrl":null,"url":null,"abstract":"This work explores underfill with improved properties for rework-ability and package reliability. Reworkable underfills (Epoxy-R1 – R5) were customized by a material supplier and benchmarked with an existing non-reworkable underfill (Epoxy-E). R1 shows similar glass transition temperature (Tg), coefficient of thermal expansion 1&2 (CTE) with Epoxy-E, lower storage modulus (30% of Epoxy-E), yet still poor for rework due to major damage on printed circuit board (PCB) detected. R2 was refined with much lower modulus, 10% of Epoxy-E, but failed to meet target Tg and CTE. R3 used smaller filler size (10um) in formulation, reliability related properties were significantly improved, however, same overheat issue on adjacent component and insufficient coverage was found. For R4 and R5, both Tg reached above 130°C and low CTE-2 around 100ppm/°C, which is only 70% of Epoxy-E. For rework evaluation, R4 and R5 showed good results, no adjacent defects which are suspected due to lower adhesion, underfill is easier to remove. R5 was selected for reliability test due to its similarity in viscosity and process condition compared to Epoxy-E with minimal change in dispensing process setup. R5 test vehicle survived 1000 thermal cycling (-40°C to 85°C) meeting mechanical shock and vibration tests qualification. Lastly, it was observed that R5 achieved both rework-ability and package reliability expectations with a new defined thermo-mechanical property.","PeriodicalId":139520,"journal":{"name":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Thermo-Mechanical Reworkable Epoxy Underfill in Board-Level Package: Material Characteristics and Reliability Criteria\",\"authors\":\"Saw Lip Teng, M. Devarajan\",\"doi\":\"10.1109/ectc51906.2022.00275\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work explores underfill with improved properties for rework-ability and package reliability. Reworkable underfills (Epoxy-R1 – R5) were customized by a material supplier and benchmarked with an existing non-reworkable underfill (Epoxy-E). R1 shows similar glass transition temperature (Tg), coefficient of thermal expansion 1&2 (CTE) with Epoxy-E, lower storage modulus (30% of Epoxy-E), yet still poor for rework due to major damage on printed circuit board (PCB) detected. R2 was refined with much lower modulus, 10% of Epoxy-E, but failed to meet target Tg and CTE. R3 used smaller filler size (10um) in formulation, reliability related properties were significantly improved, however, same overheat issue on adjacent component and insufficient coverage was found. For R4 and R5, both Tg reached above 130°C and low CTE-2 around 100ppm/°C, which is only 70% of Epoxy-E. For rework evaluation, R4 and R5 showed good results, no adjacent defects which are suspected due to lower adhesion, underfill is easier to remove. R5 was selected for reliability test due to its similarity in viscosity and process condition compared to Epoxy-E with minimal change in dispensing process setup. R5 test vehicle survived 1000 thermal cycling (-40°C to 85°C) meeting mechanical shock and vibration tests qualification. Lastly, it was observed that R5 achieved both rework-ability and package reliability expectations with a new defined thermo-mechanical property.\",\"PeriodicalId\":139520,\"journal\":{\"name\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ectc51906.2022.00275\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc51906.2022.00275","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

这项工作探索了具有改进的再加工能力和包装可靠性的下填料。可返修底填料(环氧- r1 - R5)由材料供应商定制,并与现有不可返修底填料(环氧- e)进行基准测试。R1显示出与环氧树脂相似的玻璃化转变温度(Tg),热膨胀系数1和2 (CTE),存储模量较低(环氧树脂的30%),但由于检测到印刷电路板(PCB)的严重损坏,返工能力仍然很差。R2的模量要低得多,为环氧树脂- e的10%,但未能达到目标Tg和CTE。R3在配方中使用较小的填料尺寸(10um),可靠性相关性能显着提高,但在相邻组件上发现了相同的过热问题和覆盖不足。对于R4和R5, Tg均达到130℃以上,CTE-2低至100ppm/℃左右,仅为环氧树脂e的70%。对于返工评价,R4和R5效果较好,无相邻缺陷,粘结力较低,下填料较易去除。由于R5在粘度和工艺条件上与环氧树脂- e相似,且点胶工艺设置变化最小,因此选择R5进行可靠性测试。R5测试车在1000次热循环(-40°C至85°C)中存活,满足机械冲击和振动测试资格。最后,观察到R5在新的定义的热机械性能下实现了返工性和封装可靠性的期望。
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Thermo-Mechanical Reworkable Epoxy Underfill in Board-Level Package: Material Characteristics and Reliability Criteria
This work explores underfill with improved properties for rework-ability and package reliability. Reworkable underfills (Epoxy-R1 – R5) were customized by a material supplier and benchmarked with an existing non-reworkable underfill (Epoxy-E). R1 shows similar glass transition temperature (Tg), coefficient of thermal expansion 1&2 (CTE) with Epoxy-E, lower storage modulus (30% of Epoxy-E), yet still poor for rework due to major damage on printed circuit board (PCB) detected. R2 was refined with much lower modulus, 10% of Epoxy-E, but failed to meet target Tg and CTE. R3 used smaller filler size (10um) in formulation, reliability related properties were significantly improved, however, same overheat issue on adjacent component and insufficient coverage was found. For R4 and R5, both Tg reached above 130°C and low CTE-2 around 100ppm/°C, which is only 70% of Epoxy-E. For rework evaluation, R4 and R5 showed good results, no adjacent defects which are suspected due to lower adhesion, underfill is easier to remove. R5 was selected for reliability test due to its similarity in viscosity and process condition compared to Epoxy-E with minimal change in dispensing process setup. R5 test vehicle survived 1000 thermal cycling (-40°C to 85°C) meeting mechanical shock and vibration tests qualification. Lastly, it was observed that R5 achieved both rework-ability and package reliability expectations with a new defined thermo-mechanical property.
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