{"title":"光电子技术对ULSI的影响","authors":"I. Hayashi","doi":"10.1109/VLSIC.1990.111077","DOIUrl":null,"url":null,"abstract":"Progress in OEIC (optoelectronic integrated-circuit) technologies is briefly reviewed, and the feasibility of optically integrated ULSI is examined. It is concluded that an overall delay time of 0.1-0.2 ns will be achievable for a bus line in ULSI using optical interconnections, which is more than one order of magnitude faster than the conventional metal wire bus line. Future prospects in optoelectronics are addressed","PeriodicalId":239990,"journal":{"name":"Digest of Technical Papers., 1990 Symposium on VLSI Circuits","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impacts of optoelectronics technology on ULSI\",\"authors\":\"I. Hayashi\",\"doi\":\"10.1109/VLSIC.1990.111077\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Progress in OEIC (optoelectronic integrated-circuit) technologies is briefly reviewed, and the feasibility of optically integrated ULSI is examined. It is concluded that an overall delay time of 0.1-0.2 ns will be achievable for a bus line in ULSI using optical interconnections, which is more than one order of magnitude faster than the conventional metal wire bus line. Future prospects in optoelectronics are addressed\",\"PeriodicalId\":239990,\"journal\":{\"name\":\"Digest of Technical Papers., 1990 Symposium on VLSI Circuits\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Technical Papers., 1990 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.1990.111077\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Technical Papers., 1990 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1990.111077","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Progress in OEIC (optoelectronic integrated-circuit) technologies is briefly reviewed, and the feasibility of optically integrated ULSI is examined. It is concluded that an overall delay time of 0.1-0.2 ns will be achievable for a bus line in ULSI using optical interconnections, which is more than one order of magnitude faster than the conventional metal wire bus line. Future prospects in optoelectronics are addressed