高压IGBT低温边缘终止技术研究

R. Saitoh, M. Yoshino, M. Otsuki, K. Sukurai
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引用次数: 0

摘要

通过仿真研究和先进的工艺技术,改进了边缘端接结构,为大功率电子工业的应用和牵引提供了动力。在轨道牵引应用中,功率器件可能在相对较低的环境温度下同时承受高电压和大电流。在该领域,即使在-40/spl°C的低环境温度下,也强烈要求指定的最大阻断电压。阻断电压的温度依赖性强烈地依赖于边缘终止结构。我们开发了一种高压IGBT,它对阻断电压的温度依赖性较低,它的边缘终端是带偏移场板的场限制环上的半电阻膜。这项技术将使IGBT的应用领域向更高的电压和更苛刻的工作条件扩展。
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A study on edge termination technique at low temperature for high voltage IGBT
By a simulation study and advanced process technologies, the edge termination structure has been modified for a high power electronic industrial applications and traction. In the rail traction application, the power devices may be subjected to both high voltage and high current at a relative low ambient temperature. In this field, a specified maximum blocking voltage is strongly requested even at the low ambient temperature of -40/spl deg/C. The temperature dependence of the blocking voltage is strongly dependent on the edge termination structure. We developed a high voltage IGBT having a lower temperature dependence of the blocking voltage, which has an edge termination with a semi-resistive film over field limiting rings with the offset field plates. This technology will spread the application field of IGBT toward higher voltages and more demanding operating conditions.
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Bonded SOI technologies for high voltage applications Design considerations and characteristics of rugged punchthrough (PT) IGBTs with 4.5 kV blocking capability Two-dimensional analysis of surge response in thyristor lightning surge protection devices Grounded-trench-MOS structure assisted normally-off bipolar-mode power FET Experimental verification of large current capability of lateral IEGTs on SOI
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