D. Lambert, F. Desnoyers, D. Thouvenot, O. Riant, Jérémy Galinat, B. Azaïs, T. Colladant
{"title":"在sram和fpga中由几个MeV中子引起的单事件扰动","authors":"D. Lambert, F. Desnoyers, D. Thouvenot, O. Riant, Jérémy Galinat, B. Azaïs, T. Colladant","doi":"10.1109/NSREC.2017.8115444","DOIUrl":null,"url":null,"abstract":"Single Event Effect (SEE) characterizations under a few MeV neutrons are presented for various commercial SRAMs and FPGAs.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Single Event upsets induced by a few MeV neutrons in SRAMs and FPGAs\",\"authors\":\"D. Lambert, F. Desnoyers, D. Thouvenot, O. Riant, Jérémy Galinat, B. Azaïs, T. Colladant\",\"doi\":\"10.1109/NSREC.2017.8115444\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single Event Effect (SEE) characterizations under a few MeV neutrons are presented for various commercial SRAMs and FPGAs.\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"82 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115444\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115444","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}