带0.35mm球距6面保护的600mm FOPLP封装可靠性评估

Jacinta Aman Lim, B. Dunlap, S. Hong, H. Shin, Byung-Cheol Kim
{"title":"带0.35mm球距6面保护的600mm FOPLP封装可靠性评估","authors":"Jacinta Aman Lim, B. Dunlap, S. Hong, H. Shin, Byung-Cheol Kim","doi":"10.1109/ectc51906.2022.00136","DOIUrl":null,"url":null,"abstract":"6-sided die protection on 600mm x 600mm Fan-Out Panel Level Packaging (FOPLP) has emerged as a scale up alternative to 300mm Fan-Out Wafer Level Packaging (FOWLP). In comparison to a 300mm round panel, a 600mm x 600mm panel could fit 5 times more 200mm wafers than a 300mm round panel. The need for migrating to carrier sizes larger than 300mm for FOWLP becomes a necessity to lower down costs and handle higher volumes. Although 600mm FOPLP is in its early stages of adoption by mainstream Wafer Level Packaging (WLP), questions arise on the performance and comparison to its 300mm FOWLP counterpart.As opposed to its 300mm round panel predecessor for 6-sided die protection with mold compound, several material sets used for panel processing had to be revisited such as polymer concentration for thin film and large panel processing for metal deposition such as seed layer and redistribution layers. Affects of photolithography on large panel and subsequent downstream process such as panel backside thinning will need to be considered for overall package reliability.This paper will describe the differences and similarities between 600mm x 600mm FOPLP and 300mm round panel FOWLP utilizing a 6-sided die protection process. We will review the key metrics that affect package reliability such as Fan-Out Ratio, thin film/build up process and scaling up from 300mm round panel FOWLP to 600mm FOPLP. Finally, we will present the package reliability performance between a 300mm FOWLP versus 600mm x 600mm FOPLP.","PeriodicalId":139520,"journal":{"name":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Package Reliability Evaluation of 600mm FOPLP with 6-Sided Die Protection with 0.35mm Ball Pitch\",\"authors\":\"Jacinta Aman Lim, B. Dunlap, S. Hong, H. Shin, Byung-Cheol Kim\",\"doi\":\"10.1109/ectc51906.2022.00136\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"6-sided die protection on 600mm x 600mm Fan-Out Panel Level Packaging (FOPLP) has emerged as a scale up alternative to 300mm Fan-Out Wafer Level Packaging (FOWLP). In comparison to a 300mm round panel, a 600mm x 600mm panel could fit 5 times more 200mm wafers than a 300mm round panel. The need for migrating to carrier sizes larger than 300mm for FOWLP becomes a necessity to lower down costs and handle higher volumes. Although 600mm FOPLP is in its early stages of adoption by mainstream Wafer Level Packaging (WLP), questions arise on the performance and comparison to its 300mm FOWLP counterpart.As opposed to its 300mm round panel predecessor for 6-sided die protection with mold compound, several material sets used for panel processing had to be revisited such as polymer concentration for thin film and large panel processing for metal deposition such as seed layer and redistribution layers. Affects of photolithography on large panel and subsequent downstream process such as panel backside thinning will need to be considered for overall package reliability.This paper will describe the differences and similarities between 600mm x 600mm FOPLP and 300mm round panel FOWLP utilizing a 6-sided die protection process. We will review the key metrics that affect package reliability such as Fan-Out Ratio, thin film/build up process and scaling up from 300mm round panel FOWLP to 600mm FOPLP. Finally, we will present the package reliability performance between a 300mm FOWLP versus 600mm x 600mm FOPLP.\",\"PeriodicalId\":139520,\"journal\":{\"name\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ectc51906.2022.00136\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc51906.2022.00136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

600mm x 600mm扇出面板级封装(FOPLP)上的6面芯片保护已经成为300mm扇出晶圆级封装(FOWLP)的扩展替代方案。与300mm圆面板相比,600mm x 600mm面板可以容纳5倍于300mm圆面板的200mm晶圆。为了降低成本和处理更高的产量,FOWLP需要迁移到大于300mm的载体尺寸。虽然主流晶圆级封装(WLP)采用600mm FOPLP尚处于早期阶段,但与300mm FOPLP相比,其性能和比较方面仍存在问题。与使用模具化合物保护的300mm圆形面板相比,用于面板加工的几种材料必须重新考虑,例如用于薄膜的聚合物浓度和用于金属沉积(如种子层和再分配层)的大型面板加工。光刻对大型面板和后续下游工艺(如面板背面变薄)的影响将需要考虑整体封装可靠性。本文将描述600mm x 600mm FOPLP和300mm圆面板FOWLP之间的差异和相似之处,利用6面模具保护工艺。我们将回顾影响封装可靠性的关键指标,如扇出比、薄膜/构建工艺以及从300mm圆面板FOPLP扩展到600mm FOPLP。最后,我们将介绍300mm FOPLP与600mm × 600mm FOPLP之间的封装可靠性性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Package Reliability Evaluation of 600mm FOPLP with 6-Sided Die Protection with 0.35mm Ball Pitch
6-sided die protection on 600mm x 600mm Fan-Out Panel Level Packaging (FOPLP) has emerged as a scale up alternative to 300mm Fan-Out Wafer Level Packaging (FOWLP). In comparison to a 300mm round panel, a 600mm x 600mm panel could fit 5 times more 200mm wafers than a 300mm round panel. The need for migrating to carrier sizes larger than 300mm for FOWLP becomes a necessity to lower down costs and handle higher volumes. Although 600mm FOPLP is in its early stages of adoption by mainstream Wafer Level Packaging (WLP), questions arise on the performance and comparison to its 300mm FOWLP counterpart.As opposed to its 300mm round panel predecessor for 6-sided die protection with mold compound, several material sets used for panel processing had to be revisited such as polymer concentration for thin film and large panel processing for metal deposition such as seed layer and redistribution layers. Affects of photolithography on large panel and subsequent downstream process such as panel backside thinning will need to be considered for overall package reliability.This paper will describe the differences and similarities between 600mm x 600mm FOPLP and 300mm round panel FOWLP utilizing a 6-sided die protection process. We will review the key metrics that affect package reliability such as Fan-Out Ratio, thin film/build up process and scaling up from 300mm round panel FOWLP to 600mm FOPLP. Finally, we will present the package reliability performance between a 300mm FOWLP versus 600mm x 600mm FOPLP.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Transient Thermal Modeling of Die Bond Process in Multiple Die Stacked Flash Memory Package Development and Application of the Moisture-Dependent Viscoelastic Model of Polyimide in Hygro-Thermo-Mechanical Analysis of Fan-Out Interconnect Superb sinterability of the Cu paste consisting of bimodal size distribution Cu nanoparticles for low-temperature and pressureless sintering of large-area die attachment and the sintering mechanism Demonstration of Substrate Embedded Ni-Zn Ferrite Core Solenoid Inductors Using a Photosensitive Glass Substrate A De-Embedding and Embedding Procedure for High-Speed Channel Eye Diagram Oscilloscope Measurement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1