单层Ta2O5 ReRAM的3位读方案

A. Schonhals, R. Waser, S. Menzel, V. Rana
{"title":"单层Ta2O5 ReRAM的3位读方案","authors":"A. Schonhals, R. Waser, S. Menzel, V. Rana","doi":"10.1109/NVMTS.2014.7060845","DOIUrl":null,"url":null,"abstract":"Complementary switching mechanism allows for distinguishing between different physical orientations of the conductive filament. In addition to the multilevel capability of single layer Ta2O5 devices, 3-bit information can also be stored and read in a single device. In this report, we present a novel read scheme, allowing for distinguishing 8 different states only by using 4 different resistive states with the pulse measurements. Variability and cycle-to-cycle stability of the single layer Ta2O5 complementary switching are also discussed in details.","PeriodicalId":275170,"journal":{"name":"2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)","volume":"149 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"3-bit read scheme for single layer Ta2O5 ReRAM\",\"authors\":\"A. Schonhals, R. Waser, S. Menzel, V. Rana\",\"doi\":\"10.1109/NVMTS.2014.7060845\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Complementary switching mechanism allows for distinguishing between different physical orientations of the conductive filament. In addition to the multilevel capability of single layer Ta2O5 devices, 3-bit information can also be stored and read in a single device. In this report, we present a novel read scheme, allowing for distinguishing 8 different states only by using 4 different resistive states with the pulse measurements. Variability and cycle-to-cycle stability of the single layer Ta2O5 complementary switching are also discussed in details.\",\"PeriodicalId\":275170,\"journal\":{\"name\":\"2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)\",\"volume\":\"149 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NVMTS.2014.7060845\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NVMTS.2014.7060845","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

互补开关机构允许区分导电灯丝的不同物理方向。除了单层Ta2O5器件的多电平能力外,还可以在单个器件中存储和读取3位信息。在本报告中,我们提出了一种新的读取方案,允许仅通过使用4种不同的电阻状态与脉冲测量来区分8种不同的状态。本文还详细讨论了单层Ta2O5互补开关的可变性和周期间稳定性。
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3-bit read scheme for single layer Ta2O5 ReRAM
Complementary switching mechanism allows for distinguishing between different physical orientations of the conductive filament. In addition to the multilevel capability of single layer Ta2O5 devices, 3-bit information can also be stored and read in a single device. In this report, we present a novel read scheme, allowing for distinguishing 8 different states only by using 4 different resistive states with the pulse measurements. Variability and cycle-to-cycle stability of the single layer Ta2O5 complementary switching are also discussed in details.
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