{"title":"JTAG and Hitachi's autodiagnosis","authors":"D. D'souza","doi":"10.1109/ASIC.1990.186152","DOIUrl":null,"url":null,"abstract":"The autodiagnosis technique that uses scan design is described and its relation to the IEEE Joint Test Action Group (JTAG) boundary scan is pointed out. The similarities between autodiagnosis and the JTAG boundary scan are emphasized. JTAG and the tradeoffs in such a conversion are discussed.<<ETX>>","PeriodicalId":126693,"journal":{"name":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1990.186152","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The autodiagnosis technique that uses scan design is described and its relation to the IEEE Joint Test Action Group (JTAG) boundary scan is pointed out. The similarities between autodiagnosis and the JTAG boundary scan are emphasized. JTAG and the tradeoffs in such a conversion are discussed.<>
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