{"title":"矢量大信号测量验证RF大信号器件模型的能力","authors":"D. Schreurs, E. Vandamme, S. Vandenberghe","doi":"10.1109/ARFTG.2001.327498","DOIUrl":null,"url":null,"abstract":"The trend towards system-on-chip realisation tightens the design specifications and consequently imposes high accuracy requirements on device models. This paper presents an overview of the surplus value of using vectorial large-signal measurements to validate the large-signal accuracy of RF MOSFET models. We show that these models can be evaluated at operating conditions close to real applications, such as intermodulation characterisation combined with loadpull. The large-signal model verification is not limited to analogue applications, because also the RF large-signal performance of digital circuits, such as inverters, can be examined. In this paper, we focus to the results obtained for the BSIM3v3 compact model and for the in-house developed large-signal look-up table model.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Capabilities of Vectorial Large-Signal Measurements to Validate RF Large-Signal Device Models\",\"authors\":\"D. Schreurs, E. Vandamme, S. Vandenberghe\",\"doi\":\"10.1109/ARFTG.2001.327498\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The trend towards system-on-chip realisation tightens the design specifications and consequently imposes high accuracy requirements on device models. This paper presents an overview of the surplus value of using vectorial large-signal measurements to validate the large-signal accuracy of RF MOSFET models. We show that these models can be evaluated at operating conditions close to real applications, such as intermodulation characterisation combined with loadpull. The large-signal model verification is not limited to analogue applications, because also the RF large-signal performance of digital circuits, such as inverters, can be examined. In this paper, we focus to the results obtained for the BSIM3v3 compact model and for the in-house developed large-signal look-up table model.\",\"PeriodicalId\":331830,\"journal\":{\"name\":\"58th ARFTG Conference Digest\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"58th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2001.327498\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"58th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2001.327498","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Capabilities of Vectorial Large-Signal Measurements to Validate RF Large-Signal Device Models
The trend towards system-on-chip realisation tightens the design specifications and consequently imposes high accuracy requirements on device models. This paper presents an overview of the surplus value of using vectorial large-signal measurements to validate the large-signal accuracy of RF MOSFET models. We show that these models can be evaluated at operating conditions close to real applications, such as intermodulation characterisation combined with loadpull. The large-signal model verification is not limited to analogue applications, because also the RF large-signal performance of digital circuits, such as inverters, can be examined. In this paper, we focus to the results obtained for the BSIM3v3 compact model and for the in-house developed large-signal look-up table model.