{"title":"质子辐照对ADC ADS8350的SEE和TID评价","authors":"S. Shi, D. Hiemstra, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679334","DOIUrl":null,"url":null,"abstract":"The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation\",\"authors\":\"S. Shi, D. Hiemstra, Z. Yang, L. Chen\",\"doi\":\"10.1109/NSREC45046.2021.9679334\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).\",\"PeriodicalId\":340911,\"journal\":{\"name\":\"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)\",\"volume\":\"2014 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC45046.2021.9679334\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC45046.2021.9679334","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation
The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).