质子辐照对ADC ADS8350的SEE和TID评价

S. Shi, D. Hiemstra, Z. Yang, L. Chen
{"title":"质子辐照对ADC ADS8350的SEE和TID评价","authors":"S. Shi, D. Hiemstra, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679334","DOIUrl":null,"url":null,"abstract":"The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation\",\"authors\":\"S. Shi, D. Hiemstra, Z. Yang, L. Chen\",\"doi\":\"10.1109/NSREC45046.2021.9679334\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).\",\"PeriodicalId\":340911,\"journal\":{\"name\":\"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)\",\"volume\":\"2014 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC45046.2021.9679334\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC45046.2021.9679334","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

采用105mev质子测试了ADS8350对SEE和TID的敏感性。当器件在25 krad (Si)时失效时,未观察到SEE。
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SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation
The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).
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