{"title":"超大规模集成电路制造在日本和美国","authors":"D. Hodges","doi":"10.1109/ASMC.1990.111211","DOIUrl":null,"url":null,"abstract":"Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed.<<ETX>>","PeriodicalId":158760,"journal":{"name":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"VLSI manufacturing in Japan and the United States\",\"authors\":\"D. Hodges\",\"doi\":\"10.1109/ASMC.1990.111211\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed.<<ETX>>\",\"PeriodicalId\":158760,\"journal\":{\"name\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1990.111211\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1990.111211","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed.<>
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