一类VLSI-CAD优化问题的算法分析与设计框架

C. Shi, J. Brzozowski
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引用次数: 2

摘要

建立了一个简单的数学框架,称为簇盖,用于解决多个VLSI优化问题,包括逻辑最小化,约束编码,多层拓扑平面路由,延迟故障测试的应用时序分配以及BIST增强的监控逻辑最小化。提出了两个范式,素数覆盖和贪婪剥离,用于开发精确算法和启发式算法。这些范例从先前为单个应用程序开发的算法中获取普遍适用的成分。这使得在新问题中重用已建立的技术成为可能,并为现有问题提供新的见解。这些范例非常简单,可以进行理论分析。导出了贪婪剥离性能的界;这些界限适用于许多发布的启发式,而这些启发式以前只能通过基准来评估。
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A framework for the analysis and design of algorithms for a class of VLSI-CAD optimization problems
A simple mathematical framework, called cluster-cover, is established for several VLSI optimisation problems including logic minimization, constrained encoding, multi-layer topological planar routing, application timing assignment for delay-fault testing, and minimization of monitoring logic for BIST enhancement. Two paradigms, prime covering and greedy peeling, are presented for developing both exact and heuristic algorithms. The paradigms capture generally applicable ingredients from previously developed algorithms for individual applications. This makes it possible to re-use established techniques in new problems, and provide new insights into existing problems. The paradigms are simple enough to be amenable to theoretical analysis. Bounds on the performance of greedy peeling are derived; these bounds are applicable to many published heuristics which previously could be evaluated only by benchmarks.
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