{"title":"复杂作业车间全局调度的分解程序","authors":"R. Uzsoy, Cheng-Shuo Wang","doi":"10.1109/IEMT.1997.626955","DOIUrl":null,"url":null,"abstract":"We describe a prototype decomposition procedure which uses global information on shop status to develop improved schedules for wafer fabrication facilities. The system studied contains reentrant product flows, multiple products and both unit capacity and batch machines. Preliminary experiments show that the decomposition procedure yields significantly better schedules in reasonable CPU times.","PeriodicalId":227971,"journal":{"name":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Decomposition procedures for global scheduling of complex job shops\",\"authors\":\"R. Uzsoy, Cheng-Shuo Wang\",\"doi\":\"10.1109/IEMT.1997.626955\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We describe a prototype decomposition procedure which uses global information on shop status to develop improved schedules for wafer fabrication facilities. The system studied contains reentrant product flows, multiple products and both unit capacity and batch machines. Preliminary experiments show that the decomposition procedure yields significantly better schedules in reasonable CPU times.\",\"PeriodicalId\":227971,\"journal\":{\"name\":\"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1997.626955\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1997.626955","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Decomposition procedures for global scheduling of complex job shops
We describe a prototype decomposition procedure which uses global information on shop status to develop improved schedules for wafer fabrication facilities. The system studied contains reentrant product flows, multiple products and both unit capacity and batch machines. Preliminary experiments show that the decomposition procedure yields significantly better schedules in reasonable CPU times.
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