雷达天线环内测试远场测量

A. Ozkan
{"title":"雷达天线环内测试远场测量","authors":"A. Ozkan","doi":"10.1109/AUTEST.2018.8532520","DOIUrl":null,"url":null,"abstract":"In this study, the approach of RATIL (Radar Antenna Test In the Loop) is proposed for measuring the antenna characterization, mono pulse pattern, performance of direction finding accuracy in the scope of radar antenna far field tests. RATIL is the concept for a radar which is using the internal self-resource components such like receiver, transmitter, digital signal processor etc., without using the external test equipment sources to operate the antenna tests. Thus, with this method, the test reliability and measurement accuracy is being improved, test duration is being shortened and a cost efficient solution is being achieved.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radar Antenna Test In the Loop Far-Field Measurements\",\"authors\":\"A. Ozkan\",\"doi\":\"10.1109/AUTEST.2018.8532520\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, the approach of RATIL (Radar Antenna Test In the Loop) is proposed for measuring the antenna characterization, mono pulse pattern, performance of direction finding accuracy in the scope of radar antenna far field tests. RATIL is the concept for a radar which is using the internal self-resource components such like receiver, transmitter, digital signal processor etc., without using the external test equipment sources to operate the antenna tests. Thus, with this method, the test reliability and measurement accuracy is being improved, test duration is being shortened and a cost efficient solution is being achieved.\",\"PeriodicalId\":384058,\"journal\":{\"name\":\"2018 IEEE AUTOTESTCON\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2018.8532520\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532520","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在本研究中,提出了在雷达天线远场测试范围内测量天线特性、单脉冲方向图、测向精度性能的ratl(雷达天线环路测试)方法。ratl是一种雷达的概念,它使用内部自资源组件,如接收机、发射机、数字信号处理器等,而不使用外部测试设备源来操作天线测试。因此,通过这种方法,提高了测试可靠性和测量精度,缩短了测试持续时间,并实现了成本效益的解决方案。
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Radar Antenna Test In the Loop Far-Field Measurements
In this study, the approach of RATIL (Radar Antenna Test In the Loop) is proposed for measuring the antenna characterization, mono pulse pattern, performance of direction finding accuracy in the scope of radar antenna far field tests. RATIL is the concept for a radar which is using the internal self-resource components such like receiver, transmitter, digital signal processor etc., without using the external test equipment sources to operate the antenna tests. Thus, with this method, the test reliability and measurement accuracy is being improved, test duration is being shortened and a cost efficient solution is being achieved.
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