高密度匹配六角形晶体管结构在标准CMOS技术高速应用

A. van den Bosch, M. Steyaert, W. Sansen
{"title":"高密度匹配六角形晶体管结构在标准CMOS技术高速应用","authors":"A. van den Bosch, M. Steyaert, W. Sansen","doi":"10.1109/ICMTS.1999.766245","DOIUrl":null,"url":null,"abstract":"In this paper, a very dense CMOS hexagonal transistor structure is presented. The main advantages of the transistors are the low parasitic drain and source capacitance due to the small area. The matching properties of this structure have been investigated and these results have been compared to those for traditional finger style structures. Exploiting these advantages, these transistors are very well suited for high speed applications with a demand for both good matching and small area, such as e.g. multi-bit current steering D/A converters. The test chips have been implemented in a standard 0.5 /spl mu/m CMOS technology. No adaptations to the technology have been made in order to realize the structures.","PeriodicalId":273071,"journal":{"name":"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"A high density matched hexagonal transistor structure in standard CMOS technology for high speed applications\",\"authors\":\"A. van den Bosch, M. Steyaert, W. Sansen\",\"doi\":\"10.1109/ICMTS.1999.766245\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a very dense CMOS hexagonal transistor structure is presented. The main advantages of the transistors are the low parasitic drain and source capacitance due to the small area. The matching properties of this structure have been investigated and these results have been compared to those for traditional finger style structures. Exploiting these advantages, these transistors are very well suited for high speed applications with a demand for both good matching and small area, such as e.g. multi-bit current steering D/A converters. The test chips have been implemented in a standard 0.5 /spl mu/m CMOS technology. No adaptations to the technology have been made in order to realize the structures.\",\"PeriodicalId\":273071,\"journal\":{\"name\":\"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.1999.766245\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1999.766245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

摘要

本文提出了一种非常致密的CMOS六边形晶体管结构。该晶体管的主要优点是由于面积小而具有较低的寄生漏极和源极电容。研究了这种结构的匹配特性,并将这些结果与传统手指结构的匹配特性进行了比较。利用这些优势,这些晶体管非常适合要求良好匹配和小面积的高速应用,例如多比特电流转向D/ a转换器。测试芯片已在标准的0.5 /spl μ m CMOS技术中实现。为了实现这些结构,没有对技术进行任何调整。
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A high density matched hexagonal transistor structure in standard CMOS technology for high speed applications
In this paper, a very dense CMOS hexagonal transistor structure is presented. The main advantages of the transistors are the low parasitic drain and source capacitance due to the small area. The matching properties of this structure have been investigated and these results have been compared to those for traditional finger style structures. Exploiting these advantages, these transistors are very well suited for high speed applications with a demand for both good matching and small area, such as e.g. multi-bit current steering D/A converters. The test chips have been implemented in a standard 0.5 /spl mu/m CMOS technology. No adaptations to the technology have been made in order to realize the structures.
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