氮化镓自开关二极管低温下表面电荷的偏置依赖性

E. Pérez-Martín, I. Íñiguez-de-la-Torre, T. González, C. Gaquière, J. Mateos
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摘要

在这项工作中,借助半经典二维蒙特卡罗(MC)模拟器,我们研究了在AlGaN/GaN异质结构上制造的自开关二极管(ssd)从100 K到室温的直流电流-电压曲线。由于固态硬盘的通道非常窄,表面效应的存在不仅对其直流行为起着关键作用,而且对其射频检测性能也起着关键作用。固态硬盘蚀刻侧壁负表面电荷密度σ随温度的变化是解释这些测量结果的关键量。在300 K时,常数σ的MC模拟能很好地复制实验结果。然而,为了在低温下重现I-V曲线的形状,需要一种更现实的方法,其中σ不仅取决于T,而且取决于施加的偏置V。
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Bias-dependence of surface charge at low temperature in GaN Self-Switching Diodes
In this work, with the help of a semi-classical two-dimensional Monte Carlo (MC) simulator, we study the DC current-voltage curves of Self-Switching Diodes (SSDs) fabricated on an AlGaN/GaN heterostructure from 100 K up to room temperature. Due to the very narrow channel of the SSDs, the presence of surface effects plays a key role not only on their DC behavior but also on their RF detection performance. The evolution with temperature of the negative surface charge density σ at the etched sidewalls of the SSD is the key quantity to explain the measurements. At 300 K, MC simulations with a constant value of σ are able to replicate very satisfactorily the experiments. However, to reproduce the shape of the I-V curve at low temperatures, a more realistic approach, where σ depends not only on T, but also on the applied bias V, is necessary.
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