W. Jung, Ghun-Up Cha, Young-Bae Kim, J. Baek, Choon-Kyung Kim
{"title":"VLSI设计中的集成互连电路建模","authors":"W. Jung, Ghun-Up Cha, Young-Bae Kim, J. Baek, Choon-Kyung Kim","doi":"10.1109/ASPDAC.1995.486218","DOIUrl":null,"url":null,"abstract":"An integrated interconnect modelling system, SIMS, is developed with parametrized modeling of interconnect and an interface with schematic capture and editor. SIMS automatically drives numerical interconnect simulation as directed by technology engineers, creates a polynomial model library for interconnect parasitics, generates a netlist including the SPICE model for the interconnect structure, automatically drives circuit simulations and displays the simulation results through an advanced GUI. VLSI design with SIMS makes it possible to consider parasitic effects fast and accurately, which becomes more important in deep submicron circuit design. With this capability, circuit design with optimized interconnect layout can be achieved. Ultimately, the integrated system helps to reduce the cost of technology development and the time to market by building up the concept of design for manufacturability.","PeriodicalId":119232,"journal":{"name":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Integrated interconnect circuit modeling for VLSI design\",\"authors\":\"W. Jung, Ghun-Up Cha, Young-Bae Kim, J. Baek, Choon-Kyung Kim\",\"doi\":\"10.1109/ASPDAC.1995.486218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated interconnect modelling system, SIMS, is developed with parametrized modeling of interconnect and an interface with schematic capture and editor. SIMS automatically drives numerical interconnect simulation as directed by technology engineers, creates a polynomial model library for interconnect parasitics, generates a netlist including the SPICE model for the interconnect structure, automatically drives circuit simulations and displays the simulation results through an advanced GUI. VLSI design with SIMS makes it possible to consider parasitic effects fast and accurately, which becomes more important in deep submicron circuit design. With this capability, circuit design with optimized interconnect layout can be achieved. Ultimately, the integrated system helps to reduce the cost of technology development and the time to market by building up the concept of design for manufacturability.\",\"PeriodicalId\":119232,\"journal\":{\"name\":\"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair\",\"volume\":\"81 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.1995.486218\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1995.486218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Integrated interconnect circuit modeling for VLSI design
An integrated interconnect modelling system, SIMS, is developed with parametrized modeling of interconnect and an interface with schematic capture and editor. SIMS automatically drives numerical interconnect simulation as directed by technology engineers, creates a polynomial model library for interconnect parasitics, generates a netlist including the SPICE model for the interconnect structure, automatically drives circuit simulations and displays the simulation results through an advanced GUI. VLSI design with SIMS makes it possible to consider parasitic effects fast and accurately, which becomes more important in deep submicron circuit design. With this capability, circuit design with optimized interconnect layout can be achieved. Ultimately, the integrated system helps to reduce the cost of technology development and the time to market by building up the concept of design for manufacturability.