Anthony L. Wilson, D. Walz, Younes Lotfi, K. Merkel, M. Von Thun, T. Farris
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Heavy ion and TID characterization of 3.3 V voltage supervisors
We present single event transient (SET) and total ionizing dose (TID) data for the single channel voltage supervisor fabricated in a 0.35μm triple-well, mixed-signal CMOS process.
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