{"title":"RS1集成电路成品率综合分析系统","authors":"R. Trahan, K. Dean","doi":"10.1109/ASMC.1990.111229","DOIUrl":null,"url":null,"abstract":"A software-based solution for integrated-circuit (IC) yield analysis is presented. A methodology for the incorporation of process test insert, product test, and product yield data from various sources is given. This information is then formatted into a common database, specifically RS1, where both RS1 and company-generated software procedures can perform statistical yield analysis on chosen data. System features highlighted include automatic operation, modular architecture for expansion, SPC, and yield reporting capabilities. Several examples of product yield enhancements utilizing test structure data and system procedures are presented.<<ETX>>","PeriodicalId":158760,"journal":{"name":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A comprehensive IC yield analysis system in RS1\",\"authors\":\"R. Trahan, K. Dean\",\"doi\":\"10.1109/ASMC.1990.111229\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A software-based solution for integrated-circuit (IC) yield analysis is presented. A methodology for the incorporation of process test insert, product test, and product yield data from various sources is given. This information is then formatted into a common database, specifically RS1, where both RS1 and company-generated software procedures can perform statistical yield analysis on chosen data. System features highlighted include automatic operation, modular architecture for expansion, SPC, and yield reporting capabilities. Several examples of product yield enhancements utilizing test structure data and system procedures are presented.<<ETX>>\",\"PeriodicalId\":158760,\"journal\":{\"name\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1990.111229\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1990.111229","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A software-based solution for integrated-circuit (IC) yield analysis is presented. A methodology for the incorporation of process test insert, product test, and product yield data from various sources is given. This information is then formatted into a common database, specifically RS1, where both RS1 and company-generated software procedures can perform statistical yield analysis on chosen data. System features highlighted include automatic operation, modular architecture for expansion, SPC, and yield reporting capabilities. Several examples of product yield enhancements utilizing test structure data and system procedures are presented.<>
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