{"title":"通过提高形态和界面稳定性来减少有机光伏电池的烧蚀损失(会议报告)","authors":"Kyungkon Kim","doi":"10.1117/12.2531612","DOIUrl":null,"url":null,"abstract":"With rapid advances in the development of new conjugated polymers, non-fullerene acceptors, the power conversion efficiency (PCE) of OPVs has been increased over 14%. However, a major drawback for the commercialization of OPVs is their long-term stability under continuous operation. Especially, OPVs suffer from a rapid decrease in PCE during initial device operation, which is known as the “burn-in loss”. It is considered that the origin of the burn-in loss is mainly related with the instability of the BHJ morphology and/or interface rather than the photooxidation of the photoactive layer. We find that the photoactive layer prepared by a sequential solution deposition is more stable than that prepared by blend solution deposition. We also find that the burn-in loss is closely related with stability of photoactive layer / electron transporting layer interface.","PeriodicalId":342552,"journal":{"name":"Organic, Hybrid, and Perovskite Photovoltaics XX","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reducing burn-in loss in organic photovoltaics by enhancing the morphological and interfacial stability (Conference Presentation)\",\"authors\":\"Kyungkon Kim\",\"doi\":\"10.1117/12.2531612\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With rapid advances in the development of new conjugated polymers, non-fullerene acceptors, the power conversion efficiency (PCE) of OPVs has been increased over 14%. However, a major drawback for the commercialization of OPVs is their long-term stability under continuous operation. Especially, OPVs suffer from a rapid decrease in PCE during initial device operation, which is known as the “burn-in loss”. It is considered that the origin of the burn-in loss is mainly related with the instability of the BHJ morphology and/or interface rather than the photooxidation of the photoactive layer. We find that the photoactive layer prepared by a sequential solution deposition is more stable than that prepared by blend solution deposition. We also find that the burn-in loss is closely related with stability of photoactive layer / electron transporting layer interface.\",\"PeriodicalId\":342552,\"journal\":{\"name\":\"Organic, Hybrid, and Perovskite Photovoltaics XX\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Organic, Hybrid, and Perovskite Photovoltaics XX\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2531612\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Organic, Hybrid, and Perovskite Photovoltaics XX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2531612","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reducing burn-in loss in organic photovoltaics by enhancing the morphological and interfacial stability (Conference Presentation)
With rapid advances in the development of new conjugated polymers, non-fullerene acceptors, the power conversion efficiency (PCE) of OPVs has been increased over 14%. However, a major drawback for the commercialization of OPVs is their long-term stability under continuous operation. Especially, OPVs suffer from a rapid decrease in PCE during initial device operation, which is known as the “burn-in loss”. It is considered that the origin of the burn-in loss is mainly related with the instability of the BHJ morphology and/or interface rather than the photooxidation of the photoactive layer. We find that the photoactive layer prepared by a sequential solution deposition is more stable than that prepared by blend solution deposition. We also find that the burn-in loss is closely related with stability of photoactive layer / electron transporting layer interface.