用于晶体管级时序分析的SPICE验证的三层断言技术

S. Sundareswaran, D. Blaauw, A. Dharchoudhury
{"title":"用于晶体管级时序分析的SPICE验证的三层断言技术","authors":"S. Sundareswaran, D. Blaauw, A. Dharchoudhury","doi":"10.1109/ICVD.1999.745145","DOIUrl":null,"url":null,"abstract":"Static transistor level timing analysis has become a more and more accepted method for performance evaluation because of its reduced design cycle time when compared to the vector based timing analysis. These static timing analysis tools use transistor level delay modelling to identify timing-critical paths and estimate performance of the design. With increase in complexity of designs it becomes necessary to verify the timing-critical paths using SPICE-simulations. In order to perform accurate modelling for SPICE simulations, it becomes imperative to identify all the devices and the signal-states on the nodes, for a given input to output transition. The current techniques use greedy approaches for each input to output transition in a channel connected component. These techniques consider turning-on all transistors on the primary conducting path and turning-off remaining transistors on the side-paths. Thus, these techniques don't consider appropriate loading on the output node due to transistors on the side-paths and the fanout paths. These techniques also don't consider the input signal correlations. This paper presents a three-tier heuristics to determine side path assertions, such that it maximizes, as much as possible, the load at the output node, for a given set of input to output transitions. Also, a method to perform the fanout path assertions is presented. This technique has been used for SPICE-verification of the timing-critical paths of transistor level designs. The results have been compared using SPICE simulations of the same designs.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A three-tier assertion technique for SPICE verification of transistor level timing analysis\",\"authors\":\"S. Sundareswaran, D. Blaauw, A. Dharchoudhury\",\"doi\":\"10.1109/ICVD.1999.745145\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Static transistor level timing analysis has become a more and more accepted method for performance evaluation because of its reduced design cycle time when compared to the vector based timing analysis. These static timing analysis tools use transistor level delay modelling to identify timing-critical paths and estimate performance of the design. With increase in complexity of designs it becomes necessary to verify the timing-critical paths using SPICE-simulations. In order to perform accurate modelling for SPICE simulations, it becomes imperative to identify all the devices and the signal-states on the nodes, for a given input to output transition. The current techniques use greedy approaches for each input to output transition in a channel connected component. These techniques consider turning-on all transistors on the primary conducting path and turning-off remaining transistors on the side-paths. Thus, these techniques don't consider appropriate loading on the output node due to transistors on the side-paths and the fanout paths. These techniques also don't consider the input signal correlations. This paper presents a three-tier heuristics to determine side path assertions, such that it maximizes, as much as possible, the load at the output node, for a given set of input to output transitions. Also, a method to perform the fanout path assertions is presented. This technique has been used for SPICE-verification of the timing-critical paths of transistor level designs. The results have been compared using SPICE simulations of the same designs.\",\"PeriodicalId\":443373,\"journal\":{\"name\":\"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICVD.1999.745145\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

与基于矢量的定时分析相比,静态晶体管级定时分析缩短了设计周期,已成为一种越来越被人们接受的性能评估方法。这些静态时序分析工具使用晶体管级延迟建模来识别时序关键路径并估计设计的性能。随着设计复杂性的增加,有必要使用spice模拟来验证时间关键路径。为了对SPICE仿真进行准确的建模,对于给定的输入到输出转换,必须识别节点上的所有设备和信号状态。当前的技术对通道连接组件中的每个输入到输出转换使用贪婪方法。这些技术考虑打开主导通路上的所有晶体管,关闭旁导通路上剩余的晶体管。因此,这些技术没有考虑到由于侧径和扇出路径上的晶体管在输出节点上的适当负载。这些技术也不考虑输入信号的相关性。本文提出了一种三层启发式方法来确定侧路径断言,以便在给定的一组输入到输出转换中尽可能地最大化输出节点上的负载。此外,还提出了一种执行扇出路径断言的方法。该技术已用于晶体管电平设计的时序关键路径的spice验证。结果与相同设计的SPICE模拟进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A three-tier assertion technique for SPICE verification of transistor level timing analysis
Static transistor level timing analysis has become a more and more accepted method for performance evaluation because of its reduced design cycle time when compared to the vector based timing analysis. These static timing analysis tools use transistor level delay modelling to identify timing-critical paths and estimate performance of the design. With increase in complexity of designs it becomes necessary to verify the timing-critical paths using SPICE-simulations. In order to perform accurate modelling for SPICE simulations, it becomes imperative to identify all the devices and the signal-states on the nodes, for a given input to output transition. The current techniques use greedy approaches for each input to output transition in a channel connected component. These techniques consider turning-on all transistors on the primary conducting path and turning-off remaining transistors on the side-paths. Thus, these techniques don't consider appropriate loading on the output node due to transistors on the side-paths and the fanout paths. These techniques also don't consider the input signal correlations. This paper presents a three-tier heuristics to determine side path assertions, such that it maximizes, as much as possible, the load at the output node, for a given set of input to output transitions. Also, a method to perform the fanout path assertions is presented. This technique has been used for SPICE-verification of the timing-critical paths of transistor level designs. The results have been compared using SPICE simulations of the same designs.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Improved effective capacitance computations for use in logic and layout optimization Assignment and reordering of incompletely specified pattern sequences targetting minimum power dissipation FzCRITIC-a functional timing verifier using a novel fuzzy delay model Verifying Tomasulo's algorithm by refinement Superscalar processor validation at the microarchitecture level
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1